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金纳米板中的表面等离激元极化激元干涉

Surface Plasmon Polariton Interference in Gold Nanoplates.

作者信息

Beane Gary, Yu Kuai, Devkota Tuphan, Johns Paul, Brown Brendan, Wang Guo Ping, Hartland Gregory

机构信息

Department of Chemistry and Biochemistry, University of Notre Dame , Notre Dame, Indiana 46556, United States.

College of Electronic Science and Technology, Shenzhen University , Shenzhen 518060, People's Republic of China.

出版信息

J Phys Chem Lett. 2017 Oct 5;8(19):4935-4941. doi: 10.1021/acs.jpclett.7b02079. Epub 2017 Sep 27.

Abstract

Transient absorption microscopy (TAM) measurements have been used to study the optical properties of surface plasmon polariton (SPP) modes in gold nanoplates on a glass substrate. For thin gold nanoplates, the TAM images show an oscillation in the signal across the plate due to interference between the "bound" and "leaky" SPP modes. The wavelength of the interference pattern is given by λ = 2π/Δk, where Δk is the difference between the wavevectors for the bound and leaky modes and is sensitive to the dielectric constant of the material above the gold nanoplate. Back focal plane imaging was also used to measure the wavevector of the leaky mode, which, in combination with the Δk information from the TAM images, enabled the bound mode wavevector to be determined. These experiments represent the first far-field optical measurement of the wavevector for the bound mode in metal nanostructures.

摘要

瞬态吸收显微镜(TAM)测量已被用于研究玻璃衬底上金纳米板中表面等离激元极化激元(SPP)模式的光学性质。对于薄金纳米板,TAM图像显示由于“束缚”和“泄漏”SPP模式之间的干涉,信号在整个板上出现振荡。干涉图案的波长由λ = 2π/Δk给出,其中Δk是束缚模式和泄漏模式的波矢之差,并且对金纳米板上方材料的介电常数敏感。背焦平面成像也被用于测量泄漏模式的波矢,结合来自TAM图像的Δk信息,能够确定束缚模式的波矢。这些实验代表了对金属纳米结构中束缚模式波矢的首次远场光学测量。

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