Furusawa Yoshiya, Nakano-Aoki Mizuho, Matsumoto Yoshitaka, Hirayama Ryoichi, Kobayashi Alisa, Konishi Teruaki
Department of Basic Medical Sciences for Radiation Damages, National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage, Chiba, Chiba 263-8555, Japan.
Formerly at Center for Charged Particle Therapy, National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage, Chiba, Chiba 263-8555, Japan.
J Radiat Res. 2017 Nov 1;58(6):803-808. doi: 10.1093/jrr/rrx030.
The quality of the sublethal damage (SLD) after irradiation with high-linear energy transfer (LET) ion beams was investigated with low-LET photons. Chinese hamster V79 cells and human squamous carcinoma SAS cells were first exposed to a priming dose of different ion beams at different LETs at the Heavy Ion Medical Accelerator in the Chiba facility. The cells were kept at room temperature and then exposed to a secondary test dose of X-rays. Based on the repair kinetics study, the surviving fraction of cells quickly increased with the repair time, and reached a plateau in 2-3 h, even when cells had received priming monoenergetic high-LET beams or spread-out Bragg peak beams as well as X-ray irradiation. The shapes of the cell survival curves from the secondary test X-rays, after repair of the damage caused by the high-LET irradiation, were similar to those obtained from cells exposed to primary X-rays only. Complete SLD repairs were observed, even when the LET of the primary ion beams was very high. These results suggest that the SLD caused by high-LET irradiation was repaired well, and likewise, the damage caused by the X-rays. In cells where the ion beam had made a direct hit in the core region in an ion track, lethal damage to the domain was produced, resulting in cell death. On the other hand, in domains that had received a glancing hit in the low-LET penumbra region, the SLD produced was completely repaired.
利用低传能线密度(LET)光子研究了高传能线密度(LET)离子束辐照后亚致死损伤(SLD)的质量。首先,在中国千叶重离子医学加速器设施中,将中国仓鼠V79细胞和人鳞状上皮癌SAS细胞暴露于不同LET值的不同离子束的预照射剂量下。细胞在室温下保存,然后再接受一次X射线的二次测试剂量照射。基于修复动力学研究,即使细胞接受了预照射单能高LET束、扩展布拉格峰束以及X射线照射,细胞的存活分数也会随着修复时间迅速增加,并在2 - 3小时内达到平台期。高LET辐照造成的损伤修复后,二次测试X射线的细胞存活曲线形状与仅暴露于初次X射线的细胞所获得的曲线形状相似。即使初次离子束的LET值非常高,也观察到了亚致死损伤的完全修复。这些结果表明,高LET辐照造成的亚致死损伤得到了很好的修复,同样地,X射线造成的损伤也得到了很好的修复。在离子束直接命中离子径迹核心区域的细胞中,会对该区域产生致死性损伤,导致细胞死亡。另一方面,在低LET半影区域受到掠射的区域,所产生的亚致死损伤得到了完全修复。