Zhou Xiang, Guo Renhui, Zhu Wenhua, Zheng Donghui, Chen Lei
Appl Opt. 2017 Oct 10;56(29):8040-8047. doi: 10.1364/AO.56.008040.
We propose a pinhole linear polarizer point-diffraction interferometer (PLP-PDI) for dynamic wavefront measurements. The proposed interferometer uses a metallic wire grid linear polarizer that acts as a point-diffraction plate to generate an ideal spherical wave, from which we can obtain orthogonally polarized reference and test beams. The special polarization phase-shifting configuration allows four phase-shifted interferograms to be captured in a single shot with high precision and stability. The wavefront can then be reconstructed using a phase-unwrapping algorithm. In this paper, we describe the theory of the PLP-PDI and analyze the possible errors introduced by the device. The feasibility of the proposed PLP-PDI was verified by direct measurements of a wavefront. The experimental results show that the proposed PLP-PDI is an effective and efficient tool for the dynamic measurement of wavefronts.
我们提出了一种用于动态波前测量的针孔线性偏振器点衍射干涉仪（PLP-PDI）。所提出的干涉仪使用金属线栅线性偏振器，其作为点衍射板来产生理想的球面波，从中我们可以获得正交偏振的参考光束和测试光束。特殊的偏振相移配置允许在单次拍摄中高精度、稳定地捕获四张相移干涉图。然后可以使用相位解包裹算法重建波前。在本文中，我们描述了PLP-PDI的原理，并分析了该装置可能引入的误差。通过对波前的直接测量验证了所提出的PLP-PDI的可行性。实验结果表明，所提出的PLP-PDI是一种用于波前动态测量的有效且高效的工具。
