Zhou Pengwei, Peng Hekuo, Chen Yongchao, Xu Hang, Jia Bo, Xiao Qian
Appl Opt. 2017 Oct 10;56(29):8275-8282. doi: 10.1364/AO.56.008275.
We theoretically and experimentally demonstrate a method for measuring the phase and intensity noise and their correlation in superluminescent diodes. A Michelson interferometer containing strongly unbalanced paths has been developed to measure the noise. By the spectral analysis of the photocurrents in detectors, the intensity noise is about twice the value of the phase noise in the superluminescent diode. The more interesting result we obtained is the experimental evidence that the intensity noise and the phase noise are mutually independent. The correlation coefficient of the intensity noise and the phase noise fluctuates between -0.08 and 0, which shows scarcely any sign of amplitude-phase noise correlation. The results offer a basic premise for the analysis of broadband light sources.
我们从理论和实验上演示了一种测量超发光二极管中相位噪声、强度噪声及其相关性的方法。已开发出一种包含严重不平衡光路的迈克尔逊干涉仪来测量噪声。通过对探测器中光电流的光谱分析，超发光二极管中的强度噪声约为相位噪声值的两倍。我们获得的更有趣的结果是强度噪声和相位噪声相互独立的实验证据。强度噪声和相位噪声的相关系数在-0.08至0之间波动，几乎没有任何幅度-相位噪声相关性的迹象。这些结果为宽带光源的分析提供了一个基本前提。
