Adamson Peep
Appl Opt. 2017 Oct 1;56(28):7832-7840. doi: 10.1364/AO.56.007832.
A new optical method for determining anisotropic dielectric constants of graphene-like two-dimensional materials on semiconductor or metal substrates is developed. The method is based on the surface differential reflectance measurements at three different incident angles. The inversion problem is resolved analytically in a long-wavelength approximation, where graphene is discussed within the framework of macroscopic electrodynamics as a uniaxially anisotropic film with the optical axis perpendicular to the film surface. The method is fast and has no need for the initial guesses of the desired parameters. It also offers an effective technique to get good start points for iterative numerical methods to improve the preliminary results. The method is unique in its simplicity and, therefore, important for graphene research.
开发了一种用于确定半导体或金属衬底上类石墨烯二维材料各向异性介电常数的新光学方法。该方法基于在三个不同入射角下的表面微分反射率测量。在长波长近似下解析地解决了反演问题，其中将石墨烯在宏观电动力学框架内作为光轴垂直于薄膜表面的单轴各向异性薄膜进行讨论。该方法快速且无需对所需参数进行初始猜测。它还提供了一种有效的技术，可为迭代数值方法获得良好的起始点以改进初步结果。该方法以其简单性而独特，因此对石墨烯研究很重要。
