Sheng Hong, Xu Jing, Zhang Song
Appl Opt. 2017 Oct 20;56(30):8452-8460. doi: 10.1364/AO.56.008452.
Fringe projection profilometry (FPP) has been widely used for three-dimensional reconstruction, surface measurement, and reverse engineering. However, FPP is prone to overexposure if objects have a wide range of reflectance. In this paper, we propose a dynamic projection theory based on FPP to rapidly measure the overexposed region with an attempt to conquer this challenge. This theory modifies the projected fringe image to the next better measurement based on the feedback provided by the previously captured image intensity. Experiments demonstrated that the number of overexposed points can be drastically reduced after one or two iterations. Compared with the state-of-the-art methods, our proposed dynamic projection theory measures the overexposed region quickly and effectively and, thus, broadens the applications of FPP.
条纹投影轮廓术（FPP）已广泛应用于三维重建、表面测量和逆向工程。然而，如果物体的反射率范围很广，FPP容易出现过度曝光的情况。在本文中，我们提出了一种基于FPP的动态投影理论，试图通过快速测量过度曝光区域来克服这一挑战。该理论根据先前捕获的图像强度提供的反馈，将投影条纹图像修改为下一个更好的测量值。实验表明，经过一两次迭代后，过度曝光点的数量可以大幅减少。与现有方法相比，我们提出的动态投影理论能够快速有效地测量过度曝光区域，从而拓宽了FPP的应用范围。
