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钙钛矿太阳能电池TiO/CHNHPbI界面电子注入与缺陷的第一性原理研究

First-Principles Study of Electron Injection and Defects at the TiO/CHNHPbI Interface of Perovskite Solar Cells.

作者信息

Haruyama Jun, Sodeyama Keitaro, Hamada Ikutaro, Han Liyuan, Tateyama Yoshitaka

机构信息

PRESTO, Japan Science and Technology Agency (JST) , 4-1-8 Honcho, Kawaguchi, Saitama 333-0012, Japan.

出版信息

J Phys Chem Lett. 2017 Dec 7;8(23):5840-5847. doi: 10.1021/acs.jpclett.7b02622. Epub 2017 Nov 16.

Abstract

We investigated electron injection rates and vacancy defect properties by performing first-principles calculations on the interface of an anatase-TiO(001) and a tetragonal CHNHPbI(110) (MAPbI(110)). We found that the coupling matrix element between the lowest unoccupied molecular orbital of MAPbI and the TiO conduction band (CB) minimum is negligibly small, the indication being that electron-injection times for low-energy excited states are quite long (more than several tens of picoseconds). We also found that higher-lying CB states coupled more strongly; injection was expected to take place on a femtosecond time scale. Furthermore, we found that vacancy defects in the TiO layer produced undesired defect levels that caused hole traps and recombination centers. Whereas most of the vacancy defects in the MAPbI layer produced no additional states in the MAPbI gap, a Pb vacancy (V) at the interface created an energy level below the MAPbI CB edge and had a lower energy of formation than the V defect in bulk because of the interaction with the TiO surface.

摘要

我们通过对锐钛矿型TiO₂(001)与四方相CH₃NH₃PbI₃(110)(MAPbI₃(110))界面进行第一性原理计算,研究了电子注入速率和空位缺陷性质。我们发现,MAPbI₃的最低未占据分子轨道与TiO₂导带(CB)最小值之间的耦合矩阵元小到可以忽略不计,这表明低能激发态的电子注入时间相当长(超过几十皮秒)。我们还发现,较高的CB态耦合更强;预计注入将在飞秒时间尺度上发生。此外,我们发现TiO₂层中的空位缺陷产生了不希望有的缺陷能级,这些能级导致空穴陷阱和复合中心。虽然MAPbI₃层中的大多数空位缺陷在MAPbI₃能隙中没有产生额外的能级,但界面处的Pb空位(V)在MAPbI₃ CB边缘下方产生了一个能级,并且由于与TiO₂表面的相互作用,其形成能比体相中的V缺陷更低。

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