Bennett Thomas, Proctor Matthew, Forster Jon, Perivolari Eleni, Podoliak Nina, Sugden Matthew, Kirke Roger, Regrettier Thomas, Heiser Thomas, Kaczmarek Malgosia, D'Alessandro Giampaolo
Appl Opt. 2017 Nov 10;56(32):9050-9056. doi: 10.1364/AO.56.009050.
We track the non-uniformity of a wide area liquid crystal device using multiple cross-polarized intensity measurements. They give us not only accurate estimates of the core physical liquid crystal parameters, such as elastic constants, but also spatial maps of the device properties, including the liquid crystal thickness and pretilt angle. A bootstrapping statistical analysis, coupled with the multiple measurements, gives us reliable error bars on all the measured parameters.
我们使用多个交叉偏振强度测量来跟踪大面积液晶器件的不均匀性。这些测量不仅能为我们提供诸如弹性常数等核心物理液晶参数的精确估计，还能给出器件特性的空间分布图，包括液晶厚度和预倾角。结合多次测量的自举统计分析，能为我们提供所有测量参数的可靠误差范围。
