Terada K, Sato A, Ninomiya K, Kawashima Y, Shimomura K, Yoshida G, Kawai Y, Osawa T, Tachibana S
Graduate School of Science, Osaka University, Osaka, Japan.
High Energy Accelerator Research Organization, Tsukuba, Japan.
Sci Rep. 2017 Nov 13;7(1):15478. doi: 10.1038/s41598-017-15719-5.
Electron- or X-ray-induced characteristic X-ray analysis has been widely used to determine chemical compositions of materials in vast research fields. In recent years, analysis of characteristic X-rays from muonic atoms, in which a muon is captured, has attracted attention because both a muon beam and a muon-induced characteristic X-ray have high transmission abilities. Here we report the first non-destructive elemental analysis of a carbonaceous chondrite using one of the world-leading intense direct current muon beam source (MuSIC; MUon Science Innovative Channel). We successfully detected characteristic muonic X-rays of Mg, Si, Fe, O, S and C from Jbilet Winselwan CM chondrite, of which carbon content is about 2 wt%, and the obtained elemental abundance pattern was consistent with that of CM chondrites. Because of its high sensitivity to carbon, non-destructive elemental analysis with a muon beam can be a novel powerful tool to characterize future retuned samples from carbonaceous asteroids.
电子或X射线诱导的特征X射线分析已被广泛用于确定众多研究领域中材料的化学成分。近年来,对μ子被捕获的μ原子特征X射线的分析引起了关注,因为μ子束和μ子诱导的特征X射线都具有高穿透能力。在此,我们报告了首次使用世界领先的强直流μ子束源之一(MuSIC;μ子科学创新通道)对碳质球粒陨石进行无损元素分析。我们成功地从Jbilet Winselwan CM球粒陨石中检测到了Mg、Si、Fe、O、S和C的特征μ子X射线,其碳含量约为2 wt%,所获得的元素丰度模式与CM球粒陨石一致。由于其对碳具有高灵敏度,用μ子束进行无损元素分析可以成为一种新型的强大工具,用于表征未来从碳质小行星返回的样品。