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通过离子探针分析确定的牙齿中元素的深度分布。

Indepth distributions of elements in teeth, determined by ion probe analysis.

作者信息

Lodding A, Odelius H

出版信息

Microsc Acta Suppl. 1978(2):367-76.

PMID:293486
Abstract

The technique of secondary ion mass spectrometry has been applied to dental hard tissue. The method offers high sensitivity (ppb-ppm) to most elements, a topographic surface resolution of about 1 micron, and a practical depth resolution in the 10 nm range. Quantitative analysis has entailed the use of external standards or the adaptation of a thermodynamic model of the secondary ionization mechanism. The intrinsic mass spectra of secondary ions from apatite material have been studied to assess the practical detection limits for most elements of the periodic table. Fluorine studies have been performed on enamel subjected to different prophylactic treatments. The atomic mechanism of fluorine mobility in teeth have been studied in diffusion anneals. The distributions of different elements (F, Cl, P, Li, Na, K, Rb, Mg, Sr, Ba, Al, C, Pb) have been investigated in dependence of depth in the enamel and dentin from different environments.

摘要

二次离子质谱技术已应用于牙齿硬组织。该方法对大多数元素具有高灵敏度(ppb-ppm),表面形貌分辨率约为1微米,实际深度分辨率在10纳米范围内。定量分析需要使用外标或采用二次电离机制的热力学模型。已对磷灰石材料二次离子的本征质谱进行研究,以评估元素周期表中大多数元素的实际检测限。对经过不同预防治疗的牙釉质进行了氟研究。在扩散退火中研究了氟在牙齿中迁移的原子机制。研究了来自不同环境的牙釉质和牙本质中不同元素(F、Cl、P、Li、Na、K、Rb、Mg、Sr、Ba、Al、C、Pb)随深度的分布情况。

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