Qi Wenke, Jiang Pan, Lin Dan, Chi Xiaoping, Cheng Min, Du Yikui, Zhu Qihe
Beijing National Laboratory for Molecular Sciences, State Key Laboratory of Molecular Reaction Dynamics, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China.
Rev Sci Instrum. 2018 Jan;89(1):013101. doi: 10.1063/1.5006982.
A mini time-sliced ion velocity map imaging photofragment translational spectrometer using low voltage acceleration has been constructed. The innovation of this apparatus adopts a relative low voltage (30-150 V) to substitute the traditional high voltage (650-4000 V) to accelerate and focus the fragment ions. The overall length of the flight path is merely 12 cm. There are many advantages for this instrument, such as compact structure, less interference, and easy to operate and control. Low voltage acceleration gives a longer turn-around time to the photofragment ions forming a thicker Newton sphere, which provides sufficient time for slicing. Ion trajectory simulation has been performed for determining the structure dimensions and the operating voltages. The photodissociation and multiphoton ionization of O at 224.999 nm is used to calibrate the ion images and examine the overall performance of the new spectrometer. The velocity resolution (Δν/ν) of this spectrometer from O photodissociation is about 0.8%, which is better than most previous results using high acceleration voltage. For the case of CFI dissociation at 277.38 nm, many CF vibrational states have been resolved, and the anisotropy parameter has been measured. The application of low voltage acceleration has shown its advantages on the ion velocity map imaging (VMI) apparatus. The miniaturization of the VMI instruments can be realized on the premise of high resolution.
已构建了一种采用低电压加速的微型时间切片离子速度成像光碎片平移光谱仪。该装置的创新之处在于采用相对较低的电压(30 - 150 V)替代传统的高电压(650 - 4000 V)来加速和聚焦碎片离子。飞行路径的总长度仅为12 cm。该仪器具有许多优点,如结构紧凑、干扰小、易于操作和控制。低电压加速使光碎片离子的周转时间更长,形成更厚的牛顿球,为切片提供了足够的时间。已进行离子轨迹模拟以确定结构尺寸和工作电压。利用O在224.999 nm处的光解离和多光子电离来校准离子图像并检验新光谱仪的整体性能。该光谱仪由O光解离得到的速度分辨率(Δν/ν)约为0.8%,优于大多数以前使用高加速电压的结果。对于在277.38 nm处CFI的解离情况,分辨出了许多CF振动态,并测量了各向异性参数。低电压加速在离子速度成像(VMI)装置上已显示出其优势。VMI仪器的小型化可以在高分辨率的前提下实现。