Active optical sensor assessment of spider mite damage on greenhouse beans and cotton.

The two-spotted spider mite, Tetranychus urticae Koch, is an important pest of cotton in mid-southern USA and causes yield reduction and deprivation in fiber fitness. Cotton and pinto beans grown in the greenhouse were infested with spider mites at the three-leaf and trifoliate stages, respectively. Spider mite damage on cotton and bean canopies expressed as normalized difference vegetation index indicative of changes in plant health was measured for 27 consecutive days. Plant health decreased incrementally for cotton until day 21 when complete destruction occurred. Thereafter, regrowth reversed decline in plant health. On spider mite treated beans, plant vigor plateaued until day 11 when plant health declined incrementally. Results indicate that pinto beans were better suited as a host plant than cotton for rearing T. urticae in the laboratory.