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心血管植入式电子设备的使用寿命

Longevity of Cardiovascular Implantable Electronic Devices.

作者信息

Montgomery Jay A, Ellis Christopher R

机构信息

Vanderbilt Heart and Vascular Institute, Medical Center East, 5th Floor, 1215 21st Avenue South, Nashville, TN 37232, USA.

Vanderbilt Heart and Vascular Institute, Medical Center East, 5th Floor, 1215 21st Avenue South, Nashville, TN 37232, USA.

出版信息

Card Electrophysiol Clin. 2018 Mar;10(1):1-9. doi: 10.1016/j.ccep.2017.11.001. Epub 2017 Dec 8.

Abstract

Battery depletion is the most common reason for device reoperation, which is associated with significant patient morbidity and mortality. This article describes the history of pacing and defibrillation power supplies and the factors that determine the longevity of pacing and defibrillator generators with a special emphasis on factors that can be adjusted or controlled by the implanting and following physician. Optimization of longevity is attained through device selection; shock minimization; avoidance of prolonged radiofrequency telemetry; selection of higher impedance vectors; avoidance of long pulse duration when possible; and avoidance of unnecessary feature activation, such as continuous electrogram storage.

摘要

电池耗尽是设备再次手术最常见的原因,这与患者的显著发病率和死亡率相关。本文介绍了起搏和除颤电源的历史以及决定起搏和除颤器发生器寿命的因素,特别强调了可由植入医生和随访医生调整或控制的因素。通过设备选择、电击最小化、避免长时间的射频遥测、选择更高阻抗向量、尽可能避免长脉冲持续时间以及避免不必要的功能激活(如连续心电图存储)来实现寿命的优化。

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