Jóźwik Iwona, Strojny-Nędza Agata, Chmielewski Marcin, Pietrzak Katarzyna, Kurpaska Łukasz, Nosewicz Szymon
Institute of Electronic Materials Technology, Warsaw, 01-919, Poland.
National Centre for Nuclear Research, Otwock-Swierk, 05-400, Poland.
Microsc Res Tech. 2018 May;81(5):502-508. doi: 10.1002/jemt.23004. Epub 2018 Feb 21.
The performance of the present-day scanning electron microscopy (SEM) extends far beyond delivering electronic images of the surface topography. Oxide dispersion strengthened (ODS) steel is on of the most promising materials for the future nuclear fusion reactor because of its good radiation resistance, and higher operation temperature up to 750°C. The microstructure of ODS should not exceed tens of nm, therefore there is a strong need in a fast and reliable technique for their characterization. In this work, the results of low-kV SEM characterization of nanoprecipitates formed in the ODS matrix are presented. Application of highly sensitive photo-diode BSE detector in SEM imaging allowed for the registration of single nm-sized precipitates in the vicinity of the ODS alloys. The composition of the precipitates has been confirmed by TEM-EDS.
