Akbari Marjan, Ishihara Teruya
Opt Express. 2017 Feb 6;25(3):2143-2152. doi: 10.1364/OE.25.002143.
Transverse photo-induced voltage (TPIV) in 25 nm-thick Au film with random holes with 100 nm in diameter is measured for linearly, circularly and elliptically polarized light. By rotating the major axis of ellipse of the light, TPIV exhibits specific pattern depending on polarization. The experimental results are readily reproduced by assuming that the angular momentum transfer from the light beam to the film is responsible for TPIV. A novel ellipticity meter is proposed based on this mechanism.
针对直径为100nm的随机孔洞的25nm厚金膜，测量了其对线性、圆偏振和椭圆偏振光的横向光致电压（TPIV）。通过旋转椭圆光的主轴，TPIV根据偏振呈现出特定的图案。通过假设光束与薄膜之间的角动量转移是TPIV的原因，实验结果很容易得到重现。基于这一机制，提出了一种新型椭圆率计。
