Mangano Francesco, Lucchina Alberta Greco, Brucoli Matteo, Migliario Mario, Mortellaro Carmen, Mangano Carlo
Department of Medicine and Surgery, Dental School, University of Insubria, Varese.
Department of Health Sciences, University of Eastern Piedmont, Novara.
J Craniofac Surg. 2018 Nov;29(8):2255-2262. doi: 10.1097/SCS.0000000000004495.
To evaluate the long-term cumulative implant survival rate (CISR%) and cumulative implant-crown success rate (CICSR%) of single-tooth Morse-taper connection implants, with particular attention to documenting the incidence of prosthetic complications.
The customized records of all patients who had been treated with single-tooth Morse-taper connection implants in 2 dental centers during the period between January 2002 and December 2012 were revisited. These records included patient-related (gender, age at surgery, smoking, bruxism), implant-related (date of insertion, site/location, and length/diameter of the implant, previous/concomitant bone regeneration), and restoration-related (date of delivery of the provisional and final crown) information. In addition, these records contained information about any implant failure and biologic and/or prosthetic complication that occurred during the follow-up period as well as the radiographic documentation. The follow-up period comprised between 5 and 15 years. The main outcomes were CISR% and CICSR%, with the latter being defined as the condition in which no complication had affected the surviving implant-supported crown during the entire follow-up. Life-table analysis was used for the analysis of CISR% and CICSR%. Peri-implant marginal bone resorption (PIMBR) at 5, 10, and 15 years was a secondary outcome of this study.
In total, 578 patients who had received 612 implants were included in this study. The overall CISR% at 15 years was 94.8% (94.2% maxilla, 95.3% mandible). Among the surviving crowns, the overall CICSR% at 15 years was 94.5% (93.1% and 94.9% for anterior and posterior crowns, respectively), and the incidence of prosthetic complications was low (1.5%). The PIMBL amounted to 0.38 ± 0.29 mm, 0.49 ± 0.35 mm, and 0.94 ± 0.58 mm at the 5-, 10-, and 15-year follow-ups, respectively.
Morse-taper connection implants represent a reliable treatment procedure for the restoration of single-tooth gaps in the long term, with high CISR% (94.8%) at 15 years, a very low incidence of complications, and a high CICSR% (94.5%).
评估单颗牙齿莫氏锥度连接种植体的长期累积种植体存留率（CISR%）和累积种植体-牙冠成功率（CICSR%），尤其关注记录修复并发症的发生率。
回顾了2002年1月至2012年12月期间在2个牙科中心接受单颗牙齿莫氏锥度连接种植体治疗的所有患者的定制记录。这些记录包括患者相关信息（性别、手术时年龄、吸烟、磨牙症）、种植体相关信息（植入日期、部位/位置、种植体长度/直径、先前/同期骨再生情况）以及修复相关信息（临时和最终牙冠交付日期）。此外，这些记录还包含随访期间发生的任何种植体失败以及生物学和/或修复并发症的信息以及影像学记录。随访期为5至15年。主要结局指标为CISR%和CICSR%，后者定义为在整个随访期间没有并发症影响存活的种植体支持牙冠的情况。采用寿命表分析法分析CISR%和CICSR%。本研究的次要结局指标为5年、10年和15年时种植体周围边缘骨吸收（PIMBR）情况。
本研究共纳入578例接受612颗种植体的患者。15年时的总体CISR%为94.8%（上颌为94.2%，下颌为95.3%）。在存活的牙冠中，15年时的总体CICSR%为94.5%（前牙冠和后牙冠分别为93.1%和94.9%），修复并发症的发生率较低（1.5%）。在5年、10年和15年随访时，PIMBL分别为0.
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