Department of Industrial, Physical Pharmacy, College of Pharmacy , Purdue University , 575 Stadium Mall Drive , West Lafayette , Indiana 47907 , United States.
Birck Nanotechnology Center , Purdue University , 1205 West State Street , West Lafayette , Indiana 47907 , United States.
Mol Pharm. 2018 May 7;15(5):2045-2053. doi: 10.1021/acs.molpharmaceut.8b00122. Epub 2018 Apr 17.
Surface composition critically impacts stability (e.g., crystallization) and performance (e.g., dissolution) of spray dried amorphous solid dispersion (ASD) formulations; however, traditional characterization techniques such as Raman and infrared spectroscopies may not provide useful information on surface composition on the spray dried ASD particles due to low spatial resolution, high probing depth, and lack of quantitative information. This study presents an advanced surface characterization platform consisting of two complementary techniques: X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). Such a platform enables qualitative and quantitative measurements of surface composition for the fine spray dried ASD particles with ultrasurface-sensitivity (less than 10 nm from the surface) and superior spatial resolution (approximately 250 nm for ToF-SIMS). Both XPS and ToF-SIMS demonstrated that the polymer (PVPVA) was dominantly enriched on the surface of our spray dried naproxen-PVPVA ASD particles. Of a particular note was that XPS could differentiate two batches of spray dried ASD particles with a subtle difference in surface composition produced by varying feed solution solvents. This advanced surface characterization platform will provide essential surface information to understand the mechanisms underlying the impact of surface composition on stability (e.g., crystallization) and functionality (e.g., dissolution) in future studies.
表面成分对喷雾干燥无定形固体分散体(ASD)制剂的稳定性(例如结晶)和性能(例如溶解)有至关重要的影响;然而,由于空间分辨率低、探测深度高以及缺乏定量信息,传统的拉曼和红外光谱等表征技术可能无法提供有关喷雾干燥 ASD 颗粒表面成分的有用信息。本研究提出了一种由两种互补技术组成的先进表面表征平台:X 射线光电子能谱(XPS)和飞行时间二次离子质谱(ToF-SIMS)。这种平台能够对超细喷雾干燥 ASD 颗粒进行定性和定量的表面成分测量,具有超表面灵敏度(距离表面小于 10nm)和优越的空间分辨率(对于 ToF-SIMS 约为 250nm)。XPS 和 ToF-SIMS 均表明,聚合物(PVPVA)在我们的萘普生-PVPVA 喷雾干燥 ASD 颗粒表面上主要富集。值得注意的是,XPS 可以区分由改变进料溶液溶剂产生的表面成分略有差异的两批喷雾干燥 ASD 颗粒。该先进的表面表征平台将为未来的研究提供理解表面成分对稳定性(例如结晶)和功能(例如溶解)的影响机制的必要表面信息。