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载流滑动过程中受动态接触力影响的纯碳带的电弧放电

Arc Discharges of a Pure Carbon Strip Affected by Dynamic Contact Force during Current-Carrying Sliding.

作者信息

Zhang Yanyan, Zhang Yongzhen, Song Chenfei

机构信息

School of Mechanical Engineering, Northwestern Polytechnical University, Xi'an 710072, China.

National United Engineering Laboratory for Advanced Bearing Tribology, Henan University of Science and Technology, Luoyang 471023, China.

出版信息

Materials (Basel). 2018 May 15;11(5):796. doi: 10.3390/ma11050796.

DOI:10.3390/ma11050796
PMID:29762496
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC5978173/
Abstract

Arc discharges of a pure carbon strip induced by dynamic contact force were studied on a pin-on-disk tribometer. It was found that arc discharges were produced periodically in accordance with the period of the dynamic contact force. The arcing rate of the pure carbon strip increased with an increase of frequency and amplitude , which led to a decrease of current-carrying quality. These influences at high velocities became much more significant. A critical point of the arcing rate at around 2% was detected. Lower than 2%, the pure carbon strip was able to maintain its excellent current-carrying capability; higher than this point, the current-carrying quality deteriorated abruptly. SEM and XPS analysis show that the element Cu detected on the worn surface at lower arcing rates was metal Cu. CuO was found at higher arcing rates. This indicated that the wear mechanism transferred from mechanical wear to arc erosion with the increase of the arcing rate.

摘要

在销盘摩擦磨损试验机上研究了由动态接触力引起的纯碳带的电弧放电。结果发现,电弧放电根据动态接触力的周期周期性地产生。纯碳带的起弧率随着频率和振幅的增加而增加,这导致载流质量下降。在高速下这些影响变得更加显著。检测到起弧率在2%左右的一个临界点。低于2%时,纯碳带能够保持其优异的载流能力;高于此点,载流质量急剧恶化。扫描电子显微镜(SEM)和X射线光电子能谱(XPS)分析表明,在较低起弧率下磨损表面检测到的元素Cu是金属Cu。在较高起弧率下发现了CuO。这表明随着起弧率的增加,磨损机制从机械磨损转变为电弧侵蚀。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/12da/5978173/7afd23213c82/materials-11-00796-g015.jpg
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