Stan Camelia V, Tamura Nobumichi
Advanced Light Source, Lawrence Berkeley National Laboratory.
Advanced Light Source, Lawrence Berkeley National Laboratory;
J Vis Exp. 2018 Jun 19(136):57874. doi: 10.3791/57874.
In this report, we describe a detailed procedure for acquiring and processing x-ray microfluorescence (μXRF), and Laue and powder microdiffraction two-dimensional (2D) maps at beamline 12.3.2 of the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory. Measurements can be performed on any sample that is less than 10 cm x 10 cm x 5 cm, with a flat exposed surface. The experimental geometry is calibrated using standard materials (elemental standards for XRF, and crystalline samples such as Si, quartz, or Al2O3 for diffraction). Samples are aligned to the focal point of the x-ray microbeam, and raster scans are performed, where each pixel of a map corresponds to one measurement, e.g., one XRF spectrum or one diffraction pattern. The data are then processed using the in-house developed software XMAS, which outputs text files, where each row corresponds to a pixel position. Representative data from moissanite and an olive snail shell are presented to demonstrate data quality, collection, and analysis strategies.
在本报告中，我们描述了在劳伦斯伯克利国家实验室先进光源（ALS）的12.3.2光束线获取和处理X射线微荧光（μXRF）、劳厄和粉末微衍射二维（2D）图谱的详细程序。测量可以在任何尺寸小于10 cm x 10 cm x 5 cm且有平坦暴露表面的样品上进行。使用标准材料（用于XRF的元素标准以及用于衍射的晶体样品，如硅、石英或氧化铝）对实验几何结构进行校准。将样品对准X射线微束的焦点，并进行光栅扫描，图谱的每个像素对应一次测量，例如一个XRF光谱或一个衍射图案。然后使用内部开发的软件XMAS对数据进行处理，该软件输出文本文件，其中每行对应一个像素位置。展示了来自莫桑石和橄榄蜗牛壳的代表性数据，以说明数据质量、采集和分析策略。
