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BiTaTiO薄膜的铁电性能及压电力显微镜研究

Ferroelectric properties and piezoresponse force micoroscopy study of BiTaTiO thin films.

作者信息

Shin Hyun Wook, Ahn Yoonho, Son Jong Yeog

机构信息

Department of Applied Physics and_Institute of Natural Sciences, Kyung Hee University, Yongin 17104, Republic of Korea.

School of Liberal Arts, Korea University of Technology and Education, Cheonan 31253, Republic of Korea.

出版信息

Ultramicroscopy. 2019 Jan;196:49-53. doi: 10.1016/j.ultramic.2018.09.017. Epub 2018 Sep 21.

Abstract

We investigate the ferroelectric properties and crystal structures of BiTaTiO (BTTO) thin films deposited on single-crystal Nb-doped (100) SrTiO substrates via pulsed laser deposition. The BTTO films exhibited either a (001)-epitaxial crystalline structure or a mixed a- and c-oriented polycrystalline structure depending on the substrate temperature. The ferroelectric polarization and piezoelectric coefficient of the mixed a- and c-oriented film were larger than those of the (001)-epitaxial film because its polar axis was perpendicular to the c-axis. Vertical and lateral piezoresponse force microscopy studies indicate that the ferroelectric domains of the (001)-epitaxial film were all parallel to the in-plane orientation, whereas the mixed a- and c-oriented film comprised both square grains with in-plane-oriented ferroelectric domains and longish grains with ferroelectric domains out of orientation with the plane.

摘要

我们研究了通过脉冲激光沉积在单晶掺铌(100)SrTiO衬底上沉积的BiTaTiO(BTTO)薄膜的铁电性能和晶体结构。根据衬底温度,BTTO薄膜呈现出(001)外延晶体结构或a轴和c轴混合取向的多晶结构。a轴和c轴混合取向薄膜的铁电极化和压电系数大于(001)外延薄膜,因为其极轴垂直于c轴。垂直和横向压电力显微镜研究表明,(001)外延薄膜的铁电畴都与面内取向平行,而a轴和c轴混合取向薄膜既包含具有面内取向铁电畴的方形晶粒,也包含具有与平面取向不一致的铁电畴的长形晶粒。

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