Shi Liheng, Kong Lingwen, Guo Dongmei, Xia Wei, Ni Xiaoqi, Hao Hui, Wang Ming
Jiangsu Key Laboratory on Opto-Electronic Technology, School of Physics and Technology, Nanjing Normal University, Nanjing 210023, People's Republic of China.
Rev Sci Instrum. 2018 Sep;89(9):096113. doi: 10.1063/1.5026471.
In this paper, we present an orthogonally polarized self-mixing grating interferometer (SMGI) for simultaneous measurement of in-plane and out-of-plane displacements. The measurement ranges in both directions are limited only by the length of grating. The orthogonally polarized lights emitted from a birefringent He-Ne laser are separated and enter the grating at ±1st-order Littrow angles. The diffraction beams re-enter the laser cavity and cause self-mixing interference. To differentiate the orthogonally polarized lights and obtain high resolution, phase modulation technique is introduced to extract phases from the orthogonally polarized SMGI signals. The measurement results show that the proposed system can reach a submicron accuracy in the experiment. This work provides a good way to achieve high precision two-dimensional displacement measurement with a robust system configuration.
在本文中,我们提出了一种用于同时测量面内和面外位移的正交偏振自混合光栅干涉仪(SMGI)。两个方向上的测量范围仅受光栅长度限制。从双折射氦氖激光器发出的正交偏振光被分离,并以±1级利特罗角进入光栅。衍射光束重新进入激光腔并产生自混合干涉。为了区分正交偏振光并获得高分辨率,引入了相位调制技术从正交偏振的SMGI信号中提取相位。测量结果表明,所提出的系统在实验中可以达到亚微米精度。这项工作为通过稳健的系统配置实现高精度二维位移测量提供了一种很好的方法。