University of Chemistry and Technology, Prague ; Technicka 5, 166 28 Prague 6 - Dejvice, Czech Republic.
Aix Marseille Univ., Université de Toulon, CNRS, IM2NP UMR 7334, Yncréa Méditerranée, ISEN Toulon, Maison du Numérique et de l'Innovation, Place G. Pompidou, 83000 Toulon , France.
ACS Sens. 2018 Dec 28;3(12):2558-2565. doi: 10.1021/acssensors.8b00922. Epub 2018 Nov 29.
It is well-known that the applicability of phthalocyanine chemiresistors suffers from long recovery time after NO exposure. This circumstance enforces the necessity to operate the sensors at elevated temperatures (150-200 °C), which shortens the sensor lifetime and increases its power consumption (regardless, a typical measurement period is longer than 15 min). In this paper, we propose a new method for fast and effective recovery by UV-vis illumination at a low temperature (55 °C). The method is based on short illumination following short NO exposure. To support and optimize the method, we investigated the effects of light in the wavelength and intensity ranges of 375-850 nm and 0.2-0.8 mW/mm, respectively, on the rate of NO desorption from the phthalocyanine sensitive layer during the recovery period. This investigation was carried out for a set of phthalocyanine materials (ZnPc, CuPc, HPc, PbPc, and FePc) operating at slightly elevated temperatures (55-100 °C) and was further supported by the analysis of UV-vis and FTIR spectral changes. We found out that the light with the wavelength shorter than 550 nm significantly accelerates the NO desorption from ZnPc, CuPc, and FePc, and allows bringing the measurement period under 2 min and decreasing the sensor power consumption by 75%. Possible mechanisms of the light-stimulated desorption are discussed.
众所周知,酞菁化学电阻器在暴露于 NO 后恢复时间长,这限制了其适用性。这种情况迫使传感器必须在高温(150-200°C)下运行,这会缩短传感器的使用寿命并增加其功耗(无论如何,典型的测量周期都超过 15 分钟)。在本文中,我们提出了一种新的低温(55°C)下通过紫外可见光照来实现快速有效恢复的方法。该方法基于短时间的 NO 暴露后进行短时间的光照。为了支持和优化该方法,我们研究了光的波长和强度范围分别为 375-850nm 和 0.2-0.8mW/mm 对酞菁敏感层在恢复期间脱附 NO 的速率的影响。该研究是针对一组在稍高温度(55-100°C)下工作的酞菁材料(ZnPc、CuPc、HPc、PbPc 和 FePc)进行的,并通过 UV-vis 和 FTIR 光谱变化的分析得到进一步支持。我们发现,波长短于 550nm 的光会显著加速 ZnPc、CuPc 和 FePc 中 NO 的脱附,使测量周期缩短至 2 分钟以内,并将传感器的功耗降低 75%。讨论了光刺激脱附的可能机制。