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背栅二维半导体电极上电化学反应动力学的连续可逆调谐:采用流体动力学方法的稳态分析

Continuous and Reversible Tuning of Electrochemical Reaction Kinetics on Back-Gated 2D Semiconductor Electrodes: Steady-State Analysis Using a Hydrodynamic Method.

作者信息

Kim Chang-Hyun, Wang Yan, Frisbie C Daniel

机构信息

Department of Chemical Engineering and Materials Science , University of Minnesota , 421 Washington Avenue SE , Minneapolis , Minnesota 55455 , United States.

Department of Chemistry , University of Minnesota , 207 Pleasant Street SE , Minneapolis , Minnesota 55455 , United States.

出版信息

Anal Chem. 2019 Jan 15;91(2):1627-1635. doi: 10.1021/acs.analchem.8b05216. Epub 2019 Jan 3.

Abstract

Here we report the steady state kinetic analysis of field-effect-controlled outer-sphere electrochemistry on ultrathin back-gated ZnO working electrodes (i.e., 5 nm ZnO electrodes prepared on SiO/degenerate Si back gates). To achieve steady state conditions in the electrolyte phase, gate-tunable electrochemical flow cells were prepared by integrating a silicone microfluidic channel on the back-gated ZnO electrode. In these flow cells, continuous supply of fresh electrolyte generates time-invariant diffusion layers near the ZnO surface, allowing steady-state kinetic analysis as in other hydrodynamic methods. From the steady-state analysis, it was found that the electron density on the ZnO surface increases with the voltage bias, V, applied to the back gate, while the rate constant for electron transfer decreases with V. The observed trend can be explained as a result of the field-effect-induced band alignment shift at the ZnO/electrolyte interface which is predicted by our conceptual model; a positive back gate bias shifts the conduction band edge down at a given working electrode potential, leading to an increased surface electron density on ZnO, but simultaneously less overlap of the band edge with the electron acceptor states in solution, which means a lower electron transfer rate constant. Overall, the results quantitatively demonstrate that back gates and the ensuing field effect can be used to control kinetics of interfacial electron transfer at two-dimensional (2D) semiconductor electrodes.

摘要

在此,我们报告了在超薄背栅ZnO工作电极(即在SiO/简并Si背栅上制备的5 nm ZnO电极)上进行场效应控制的外球电化学稳态动力学分析。为了在电解质相中实现稳态条件,通过在背栅ZnO电极上集成一个硅微流体通道制备了栅极可调电化学流通池。在这些流通池中,新鲜电解质的持续供应在ZnO表面附近产生了随时间不变的扩散层,从而能够像其他流体动力学方法一样进行稳态动力学分析。通过稳态分析发现,ZnO表面的电子密度随着施加到背栅的电压偏置V而增加,而电子转移速率常数随V减小。观察到的趋势可以用我们的概念模型所预测的ZnO/电解质界面处场效应诱导的能带排列变化来解释;在给定的工作电极电位下,正的背栅偏置会使导带边缘向下移动,导致ZnO表面电子密度增加,但同时能带边缘与溶液中电子受体态的重叠减少,这意味着电子转移速率常数较低。总体而言,结果定量地证明了背栅和随之产生的场效应可用于控制二维(2D)半导体电极上界面电子转移的动力学。

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