Yang Feipeng, Jiang Zhang, He Qiming, Zhang Zimo, Zhou Yang, Karapetrova Evguenia, Soucek Mark D, Foster Mark D
Advanced Photon Source , Argonne National Laboratory , Argonne , Illinois 60439 , United States.
ACS Appl Mater Interfaces. 2019 Jan 23;11(3):3555-3564. doi: 10.1021/acsami.8b18009. Epub 2019 Jan 10.
A challenge of broad interest in both materials science and biology is the study of interfaces that are buried within a structure, particularly multilayer structures. Despite the enormous costs of corrosion and many decades of corrosion research, details of the mechanisms of various sorts of corrosion are still not clear, in part due to the difficulty in interrogating the interface between the corroding metal and an organic coating, which is typically used to mitigate corrosion. Generally, the performance of such coatings is evaluated by visual inspection after exposure or by modeling impedance data, which is a process not straightforwardly connected to physical interface structures. "Rocking-curve" X-ray scattering measurements provide a means of probing such interfaces due to the ability of X-rays to penetrate materials. Here, variations in the morphology of an interface between a protective coating and a metal substrate due to exposure to an electrolyte are derived from analysis of rocking-curve data in conjunction with atomic force microscopy imaging of the outer coating surface. The interfaces of cross-linked epoxy coatings with aluminum are irreversibly changed after 12 h of contact between the electrolyte solution and the face of the coating. The character of this change varies with the molecule used to cross-link the coating. Since X-ray off-specular scattering is sensitive to changes on the nanometer scale, it is also able to register interface degradation on time scales shorter than those probed by many other techniques, potentially expediting the evaluation of coatings for protection against degradation of the interface.
材料科学和生物学领域广泛关注的一个挑战是对埋于结构内部的界面进行研究,尤其是多层结构。尽管腐蚀造成了巨大成本,且经过了数十年的腐蚀研究,但各类腐蚀机制的细节仍不明确,部分原因在于难以探究腐蚀金属与通常用于减轻腐蚀的有机涂层之间的界面。一般来说,此类涂层的性能是通过暴露后的目视检查或对阻抗数据进行建模来评估的,而这一过程与物理界面结构并无直接联系。“摇摆曲线”X射线散射测量由于X射线能够穿透材料,为探测此类界面提供了一种手段。在此,通过结合对外涂层表面的原子力显微镜成像来分析摇摆曲线数据,得出了由于暴露于电解质而导致的保护涂层与金属基底之间界面形态的变化。在电解质溶液与涂层表面接触12小时后,交联环氧涂层与铝之间的界面发生了不可逆的变化。这种变化的特征随用于交联涂层的分子而有所不同。由于X射线非镜面散射对纳米尺度的变化很敏感,它还能够在比许多其他技术所探测的时间尺度更短的时间内记录界面降解情况,这有可能加快对防止界面降解的涂层的评估。