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波导耦合表面等离子体激元锥特性的实验分析。

Experimental analysis of waveguide-coupled surface-plasmon-polariton cone properties.

机构信息

U.S. Department of Energy, The Ames Laboratory, Ames, IA, 50011, United States; Department of Chemistry, Iowa State University, Ames, IA, 50011, United States.

Department of Chemistry, Iowa State University, Ames, IA, 50011, United States.

出版信息

Anal Chim Acta. 2019 Feb 7;1048:123-131. doi: 10.1016/j.aca.2018.09.057. Epub 2018 Sep 26.

DOI:10.1016/j.aca.2018.09.057
PMID:30598142
Abstract

Experimental data for waveguide-coupled surface-plasmon-polariton (SPP) cones generated from dielectric waveguides is presented. The results demonstrate a simpler route to collect plasmon waveguide resonance (i.e., PWR) data. In the reverse-Kretschmann configuration (illumination from the sample side) and Kretschmann configuration (illumination from the prism side), all the waveguide modes are excited simultaneously with p- or s-polarized incident light, which permits rapid acquisition of PWR data without the need to scan the incident angle or wavelength, in the former configuration. The concentric SPP cone properties depend on the thickness and index of refraction of the waveguide. The angular intensity pattern of the cone is well-matched to simulation results in the reverse-Kretschmann configuration, and is found to be dependent on the polarization of the incident light and the polarization of the waveguide mode. In the Kretschmann geometry, all waveguide-coupled SPP cones are measured at incident angles that produce attenuated light reflectivity. In addition, the enhanced electric field produced under total internal reflection allows high signal-to-noise ratio multimodal spectroscopies (e.g., Raman scattering, luminescence) to measure the chemical content of the waveguide film, which traditionally is not measured with PWR.

摘要

呈现了基于介质波导的波导耦合表面等离子体激元(SPP)锥的实验数据。结果表明,这是一种更简单的方法来收集等离子体波导共振(即 PWR)数据。在反向克雷斯曼配置(从样品侧照明)和克雷斯曼配置(从棱镜侧照明)中,所有波导模式都同时被 p 或 s 偏振光激发,这允许在不需要扫描入射角或波长的情况下快速获取 PWR 数据,在前一种配置中。同心 SPP 锥的特性取决于波导的厚度和折射率。锥的角强度模式与反向克雷斯曼配置中的模拟结果非常匹配,并且发现它取决于入射光的偏振和波导模式的偏振。在克雷斯曼几何中,所有波导耦合 SPP 锥都在产生衰减光反射率的入射角下进行测量。此外,全内反射下产生的增强电场允许高信噪比多模光谱学(例如拉曼散射、发光)测量波导膜的化学含量,这在传统上无法用 PWR 进行测量。

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