Mendonca Goncalo V, Teodósio Carolina, Mouro Miguel, Freitas Sandro, Mil-Homens Pedro, Pezarat-Correia Pedro, Vila-Chã Carolina
Neuromuscular Research Lab, Faculdade de Motricidade Humana, Universidade de Lisboa, Portugal, Estrada da Costa, Cruz Quebrada, Dafundo, Portugal.
CIPER, Faculdade de Motricidade Humana, Universidade de Lisboa, Portugal, Estrada da Costa, Cruz Quebrada, Dafundo, Portugal.
J Clin Neurophysiol. 2019 Mar;36(2):97-103. doi: 10.1097/WNP.0000000000000560.
The V wave is an electrophysiologic variant of the H reflex that is evoked with supramaximal stimulus intensity. In this study, we explored whether the between-day reliability of V-wave normalized amplitude varies as a function of the number of intrasession measurement trials. We also determined whether the reliability of the V wave improves after the exclusion of the initial testing trials.
Eighteen healthy, young participants (10 men and 8 women) were included in this study. Test-retest reliability was assessed using intraclass correlation coefficients and the standard error of the measurement (1.96*SEM).
The intraclass correlation coefficient values of the V-wave normalized amplitude increased in a progressive fashion with the inclusion of more than two measurement trials (from 0.41 to 0.75). The 1.96SEM scores also decreased from 12.47% to 7.60% after calculating the V-wave normalized amplitude from five versus two measurement trials. After excluding the first two trials from V-wave calculations, the intraclass correlation coefficient and the 1.96SEM score attained values of 0.88 and 6.54%, respectively.
Our findings indicate that the test-retest reliability of the V-wave response increases in a progressive fashion with more than two intrasession measurement trials (up to five trials). It also shows that to ensure maximal reliability, the first two measurement trials should be discarded from V-wave computations.
V波是在超强刺激强度下诱发的H反射的一种电生理变异。在本研究中,我们探讨了V波归一化振幅的日间可靠性是否会随着每次测试中测量次数的变化而变化。我们还确定了在排除初始测试次数后,V波的可靠性是否会提高。
本研究纳入了18名健康的年轻参与者(10名男性和8名女性)。使用组内相关系数和测量标准误差(1.96*SEM)评估重测可靠性。
随着测量次数超过两次(从0.41增至0.75),V波归一化振幅的组内相关系数值呈渐进式增加。在根据五次测量与两次测量计算V波归一化振幅后,1.96SEM分数也从12.47%降至7.60%。在V波计算中排除前两次测量后,组内相关系数和1.96SEM分数分别达到0.88和6.54%。
我们的研究结果表明,随着每次测试中测量次数超过两次(最多五次),V波反应的重测可靠性呈渐进式增加。研究还表明,为确保最大可靠性,应在V波计算中舍弃前两次测量。