Zhang Yang, Zhang Yu, Yao Tai, Hu Chang, Sui Yu, Wang Xianjie
Opt Express. 2018 Dec 24;26(26):34214-34223. doi: 10.1364/OE.26.034214.
A large lateral photovoltaic (LPV) effect with good linearity and fast response time is necessary for developing high-performance position-sensitive detectors (PSD). In this paper, we investigated the influence of the resistance of SbSe film and the Si on the LPV properties of the SbSe/p-Si junctions. The LPV exhibits a linear dependence on the laser spot position, with a maximum position sensitivity as high as 448 mV/mm. The optical relaxation time of the LPV was about 4.98 μs, which was due to the formation of the inversion layer at the SbSe/p-Si interface. Our results revealed that the high resistivity of SbSe film facilitate the LPV and confirmed the resistivity of Si substrate play a key role in the LPV properties. The giant position sensitivity and fast relaxation times of the LPV suggest that the SbSe/p-Si junction is a promising candidate for a wide range of optoelectronic device applications.
对于开发高性能位置敏感探测器(PSD)而言,具备良好线性度和快速响应时间的大横向光伏(LPV)效应是必不可少的。在本文中,我们研究了SbSe薄膜和Si的电阻对SbSe/p-Si结的LPV特性的影响。LPV对激光光斑位置呈线性依赖关系,最大位置灵敏度高达448 mV/mm。LPV的光学弛豫时间约为4.98 μs,这是由于在SbSe/p-Si界面处形成了反型层。我们的结果表明,SbSe薄膜的高电阻率有助于LPV,并证实Si衬底的电阻率在LPV特性中起关键作用。LPV巨大的位置灵敏度和快速的弛豫时间表明,SbSe/p-Si结是广泛光电器件应用的有前途的候选者。