Department of Cardiac Electrophysiology, University of California, San Diego Health System, 9452 Medical Center Drive, La Jolla, CA, USA.
Department of Cardiovascular Medicine, Mayo Clinic, 200 First St. SW, Rochester, MN, USA.
Europace. 2019 May 1;21(5):781-786. doi: 10.1093/europace/euy320.
Chronic pain at the cardiovascular implantable electronic device (CIED) generator or lead insertion site that is not otherwise manageable carries a IIA indication for extraction. However, limited data exist evaluating causes of pain and outcomes of extraction in eliminating pain. A multi-centre retrospective observational study was conducted to evaluate outcomes of patients undergoing device extraction for treatment of chronic device pain.
Twenty-seven out of 2188 lead extraction candidates (1.3%) met the chronic pain IIA indication for extraction [50 ± 16 years; 14 (51%) women]. Onset, severity, triggers, and pain management were measured before and after extraction. Device type, procedure done (with/without reimplantation), and positive tissue cultures were noted. Pain was reported as constant (n = 14; 50%), intermittent (n = 13; 46%), and movement-triggered (n = 14; 50%). Average severity of pain was seven out of 10 (10 being the worst). Post-extraction, 18 (66%) received freedom from pain, including all patients with poorly formed pockets (n = 2) and subclinical infections (n = 2). Of the 18, 11 underwent reimplantation (61%) without recurrent pain. Nine still had pain (44 ± 17 years; seven women) after extraction. Eight of the nine underwent reimplantation, three on the contralateral chest wall and five ipsilaterally. Pain severity decreased (n = 5), increased (n = 1), or was unchanged (n = 3).
Chronic pain at the CIED generator site can present as chronic or movement-triggered pain, and can be due to subclinical infection or a poorly formed device pocket. Extraction relieved constant and intermittent pain in two-thirds of patients. Extraction appears less successful in eliminating pain in women who undergo subsequent reimplantation.
心血管植入式电子设备(CIED)发生器或导线插入部位的慢性疼痛,如果其他方法无法控制,可作为 IIA 指征进行取出。然而,对于疼痛的原因和取出以消除疼痛的结果,现有数据有限。进行了一项多中心回顾性观察研究,以评估因慢性设备疼痛而行设备取出治疗的患者的结果。
在 2188 例导线取出候选者中,有 27 例(1.3%)符合慢性疼痛 IIA 取出指征[50±16 岁;14 名(51%)女性]。在取出前后测量了发病、严重程度、诱因和疼痛管理情况。记录了设备类型、进行的程序(带/不带再植入)和阳性组织培养情况。疼痛报告为持续(n=14;50%)、间歇性(n=13;46%)和运动触发(n=14;50%)。疼痛的平均严重程度为十分之七(十分为最严重)。取出后,18 例(66%)患者疼痛消失,包括所有口袋形态不良(n=2)和亚临床感染(n=2)患者。在 18 例中,11 例(61%)接受再植入后无疼痛复发。取出后仍有 9 例疼痛(44±17 岁;7 名女性)。这 9 例中有 8 例进行了再植入,其中 3 例在对侧胸壁,5 例在同侧。疼痛严重程度降低(n=5)、增加(n=1)或不变(n=3)。
CIED 发生器部位的慢性疼痛可表现为慢性或运动触发疼痛,可由亚临床感染或设备口袋形态不良引起。取出术缓解了三分之二患者的持续性和间歇性疼痛。在接受后续再植入的女性中,取出术在消除疼痛方面效果较差。