Shpilman Ze'ev, Hurvitz Gilad, Danon Liron, Shussman Tomer, Ehrlich Yosi, Maman Shlomo, Levy Izhak, Fraenkel Moshe
Plasma Physics Department, Soreq NRC, Yavne 81800, Israel.
Rev Sci Instrum. 2019 Jan;90(1):013501. doi: 10.1063/1.5051486.
A new system which combines two independent diagnostic devices on the same line of sight is used to measure the X-ray spectrum in the 50-1000 eV regime. The first device is an array of six channels of time-resolved X-ray diodes (XRD's), arranged to cover the spectral band with low spectral resolution (λ/Δλ ∼ 3). The second device is a time-integrated sinusoidal transmission grating spectrometer (STGS) with a wide spectral range coverage and moderate spectral resolution (λ/Δλ ∼ 30). The spectral band of each XRD can be tuned by selecting a cathode, an x-ray mirror, and a filter. The novel sinusoidal shape of the STGS allows acquisition of a pure first-order spectrum without contribution of high dispersion orders, resulting in a higher accuracy spectrum measurement. The system described here has recently been used [Y. Ehrlich et al., Rev. Sci. Instrum. 88, 043507 (2017)] to demonstrate an improved unfolding algorithm of an XRD-acquired spectrum, achieved by experimental information gathered from the STGS measurement.
一种将两个独立诊断设备组合在同一视线上的新系统，用于测量50 - 1000电子伏特范围内的X射线光谱。第一个设备是一个由六个时间分辨X射线二极管（XRD）通道组成的阵列，其排列方式能够以低光谱分辨率（λ/Δλ ∼ 3）覆盖光谱带。第二个设备是一个时间积分正弦透射光栅光谱仪（STGS），具有宽光谱范围覆盖和中等光谱分辨率（λ/Δλ ∼ 30）。每个XRD的光谱带可通过选择阴极、X射线镜和滤波器进行调谐。STGS的新型正弦形状允许获取纯一阶光谱，而不受高色散阶的影响，从而实现更高精度的光谱测量。这里描述的系统最近已被用于[Y. Ehrlich等人，《科学仪器评论》88, 043507 (2017)]来演示一种通过从STGS测量收集的实验信息实现的改进的XRD获取光谱的展开算法。
