Saltonstall Christopher B, Beechem Thomas E, Amatya Jatin, Floro Jerrold, Norris Pamela M, Hopkins Patrick E
Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, Virginia 22904, USA.
Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185, USA.
Rev Sci Instrum. 2019 Jan;90(1):013111. doi: 10.1063/1.5064804.
Spectral linewidths are used to assess a variety of physical properties, even as spectral overlap makes quantitative extraction difficult owing to uncertainty. Uncertainty, in turn, can be minimized with the choice of appropriate experimental conditions used in spectral collection. In response, we assess the experimental factors dictating uncertainty in the quantification of linewidth from a Raman experiment highlighting the comparative influence of (1) spectral resolution, (2) signal to noise, and (3) relative peak intensity (RPI) of the overlapping peaks. Practically, Raman spectra of SiGe thin films were obtained experimentally and simulated virtually under a variety of conditions. RPI is found to be the most impactful parameter in specifying linewidth followed by the spectral resolution and signal to noise. While developed for Raman experiments, the results are generally applicable to spectroscopic linewidth studies illuminating the experimental trade-offs inherent in quantification.
光谱线宽用于评估各种物理性质，即便由于不确定性导致光谱重叠使得定量提取变得困难。反过来，通过选择光谱采集时合适的实验条件，不确定性可以降至最低。为此，我们评估了决定拉曼实验中线宽定量不确定性的实验因素，重点突出了(1)光谱分辨率、(2)信噪比和(3)重叠峰的相对峰强度(RPI)的比较影响。实际上，通过实验获得了SiGe薄膜的拉曼光谱，并在各种条件下进行了虚拟模拟。结果发现，在确定线宽方面，RPI是最具影响力的参数，其次是光谱分辨率和信噪比。虽然该研究是针对拉曼实验开展的，但结果普遍适用于光谱线宽研究，阐明了定量过程中固有的实验权衡。
