Zhang Yu, Tian Xiaobo, Liang Rongguang
Opt Express. 2019 Feb 4;27(3):2575-2588. doi: 10.1364/OE.27.002575.
To overcome the phase shift error in phase shifting interferometry, a two-step random phase retrieval approach based on Gram-Schmidt (GS) orthonormalization and Lissajous ellipse fitting (LEF) method (GS&LEF) is proposed. It doesn't need pre-filtering, and can obtain relatively accurate phase distribution with only two phase shifted interferograms and less computational time. It is suitable for different background intensity, modulation amplitude distributions and noises. Last but not least, this method is effective for circular, straight or complex fringes. The simulations and experiments verify the correctness and feasibility of GS&LEF.
为了克服相移干涉术中的相移误差，提出了一种基于Gram-Schmidt（GS）正交归一化和李萨如图形椭圆拟合（LEF）方法的两步随机相位恢复方法（GS&LEF）。该方法无需预滤波，仅通过两幅相移干涉图就能获得相对准确的相位分布，且计算时间较短。它适用于不同的背景强度、调制幅度分布和噪声。最后但同样重要的是，该方法对圆形、直线形或复杂条纹均有效。仿真和实验验证了GS&LEF的正确性和可行性。
