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通过电子衍射图案上的积分图像相关性估算弹性应变。

Estimation of elastic strain by integrated image correlation on electron diffraction patterns.

作者信息

Shi Qiwei, Roux Stéphane, Latourte Félix, Hild François

机构信息

Laboratoire de Mécanique et Technologie (LMT), ENS Paris-Saclay/CNRS/Université Paris-Saclay, 61 Avenue du Président Wilson, Cachan 94235, France; EDF R&D, Site des Renardières, Avenue des Renardières, Ecuelles, Moret-sur-Loing 77818, France.

Laboratoire de Mécanique et Technologie (LMT), ENS Paris-Saclay/CNRS/Université Paris-Saclay, 61 Avenue du Président Wilson, Cachan 94235, France.

出版信息

Ultramicroscopy. 2019 Apr;199:16-33. doi: 10.1016/j.ultramic.2019.02.001. Epub 2019 Feb 4.

Abstract

High-angular-resolution electron backscattered diffraction (HR-EBSD) has been developed to study local elastic strains in crystals. An integrated digital image correlation (DIC) procedure for high resolution diffraction patterns, as recently proposed to bypass several problems of the conventional cross-correlation-based algorithm, was implemented. Through two examples of experimental data where the algorithm was used and compared to conventional means, the current paper illustrates the benefits of the integrated DIC method. It is found that both measurement uncertainty and computation time were simultaneously reduced. Moreover, an enhanced robustness was obtained for relatively high misorientations relative to methods based on cross-correlation. Different computing conditions are explored on experimental data. A number of practical usage conditions are proposed to achieve better precision and speed.

摘要

高角分辨率电子背散射衍射(HR-EBSD)已被开发用于研究晶体中的局部弹性应变。最近提出了一种用于高分辨率衍射图案的集成数字图像相关(DIC)程序,以绕过基于传统互相关算法的几个问题,并已实施。通过两个使用该算法并与传统方法进行比较的实验数据示例,本文阐述了集成DIC方法的优势。结果发现,测量不确定度和计算时间都同时减少了。此外,相对于基于互相关的方法,对于相对较高的取向差,该方法具有更高的稳健性。在实验数据上探索了不同的计算条件。提出了一些实际使用条件,以实现更高的精度和速度。

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