Department of Physics, National Taiwan Normal University, Taipei 116, Taiwan.
Phys Chem Chem Phys. 2019 Feb 27;21(9):4939-4946. doi: 10.1039/c8cp07062h.
Investigations exploring the inherent mechanical properties of electronic materials have grown rapidly in recent years largely because they are important in developing flexible electronics, organic displays and sensors. However, our understanding of the mechanical properties of organic semiconductors with a thin-film form remains limited. We report herein on an investigation of the structures and related elastic moduli perpendicular to the surface of a rubrene thin film. A rubrene/Si(100) film typically has a cluster-type morphology mainly comprising crystalline nanodomains within the film. We propose a structural bilayer model that can be used to explain the layered nature or characteristics of the rubrene films. As the film thickness is increased, the enhancement in elastic modulus can be attributed to the presence of a soft surface layer on a hard underlayer. Based on four-point probe measurements, the bilayered nature of such materials can be used to characterize their electrical resistive behavior while interfacial roughness is sensitive to the transport paths of conduction electrons. This information is valuable for future applications of organic semiconductors in flexible devices.
近年来，探索电子材料固有机械性能的研究迅速发展，主要是因为它们在开发柔性电子、有机显示器和传感器方面很重要。然而，我们对具有薄膜形式的有机半导体的机械性能的理解仍然有限。本文报告了对并五苯薄膜表面垂直方向的结构和相关弹性模量的研究。并五苯/硅（100）薄膜通常具有主要由薄膜内的晶态纳米区组成的团簇型形态。我们提出了一个结构双层模型，可以用来解释并五苯薄膜的层状性质或特征。随着薄膜厚度的增加，弹性模量的增强可以归因于硬底层上存在软表面层。基于四点探针测量，这种材料的双层性质可用于表征其电阻行为，而界面粗糙度对传导电子的输运路径敏感。这些信息对于有机半导体在柔性器件中的未来应用很有价值。
