Department of Energy Conversion and Storage, Technical University of Denmark, Frederiksborgvej 399, DK-4000 Roskilde, Denmark.
Nanoscale. 2019 Mar 7;11(10):4394-4406. doi: 10.1039/c8nr07678b.
Conventional Ni/yttria-stabilized zirconia (YSZ) electrodes in solid oxide cells experience fast degradation when operated for the electrolysis of steam at high current densities. This study presents a relatively simple procedure of infiltrating Ce0.8Gd0.2O2-δ (CGO) nanoparticles into the Ni/YSZ electrode to achieve a stable cell performance. The long-term durability tests of the cells with a bare Ni/YSZ electrode and a CGO-infiltrated Ni/YSZ electrode were performed at 800 °C and -1.25 A cm-2. The cell stability was investigated by measuring the cell voltage and obtaining the electro-chemical impedance spectra. The post-mortem analysis of the tested cells was conducted via scanning and transmission electron microscopy. The CGO nanoparticle infiltration reduced the cell voltage degradation rate from 699 mV kh-1 for the bare Ni/YSZ electrode to 66 mV kh-1 for the infiltrated electrode. The investigation showed that after introducing CGO nanoparticles, the steam reduction mechanism changed, and the electrode degradation originated from different mechanisms than that for the bare Ni/YSZ electrode.
在固体氧化物电池中,传统的镍/氧化钇稳定氧化锆(YSZ)电极在高电流密度下电解蒸汽时会迅速降解。本研究提出了一种相对简单的方法,即将 Ce0.8Gd0.2O2-δ(CGO)纳米颗粒渗透到 Ni/YSZ 电极中,以实现稳定的电池性能。在 800°C 和-1.25 A cm-2 下,对具有裸 Ni/YSZ 电极和 CGO 渗透 Ni/YSZ 电极的电池进行了长期耐久性测试。通过测量电池电压和获得电化学阻抗谱来研究电池稳定性。通过扫描和透射电子显微镜对测试后的电池进行了后处理分析。CGO 纳米颗粒的渗透将裸 Ni/YSZ 电极的电池电压降解率从 699 mV kh-1降低到渗透电极的 66 mV kh-1。研究表明,引入 CGO 纳米颗粒后,蒸汽还原机制发生了变化,电极降解的机制与裸 Ni/YSZ 电极不同。