The Quantification of Radiation Damage in Orthophosphates Using Confocal μ-Luminescence Spectroscopy of Nd.

In this study, we present a new concept based on the steady-state, laser-induced photoluminescence of Nd, which aims at a direct determination of the amorphous fraction in monazite- and xenotime-type orthophosphates on a micrometer scale. Polycrystalline, cold-pressed, sintered LaPO, and YPO ceramics were exposed to quadruple Au-ion irradiation with ion energies 35 MeV (50% of the respective total fluence), 22 MeV (21%), 14 MeV (16%), and 7 MeV (13%). Total irradiation fluences were varied in the range 1.6 × 10-6.5 × 10 ions/cm. Ion-irradiation resulted in amorphization and damage accumulation unto a depth of ~5 μm below the irradiated surfaces. The amorphous fraction created was quantified by means of surface-sensitive grazing-incidence X-ray diffraction and photoluminescence spectroscopy using state-of-the-art confocal spectrometers with spatial resolution in the μm range. Monazite-type LaPO was found to be more susceptible to ion-irradiation induced damage accumulation than xenotime-type YPO. Transmission electron microscopy of lamella cut from irradiated surfaces with the focused-ion beam technique confirmed damage depth-profiles with those obtained from PL hyperspectral mapping. Potential analytical advantages that arise from an improved characterization and quantification of radiation damage (i.e., ) on the μm-scale are discussed.