• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

环境对基于自准直仪的角度和形状测量的影响。

Environmental influences on autocollimator-based angle and form metrology.

作者信息

Geckeler Ralf D, Křen Petr, Just Andreas, Schumann Matthias, Krause Michael, Lacey Ian, Yashchuk Valeriy V

机构信息

Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany.

Czech Metrology Institute, Okružní 31, 63800 Brno, Czech Republic.

出版信息

Rev Sci Instrum. 2019 Feb;90(2):021705. doi: 10.1063/1.5057402.

DOI:10.1063/1.5057402
PMID:30831764
Abstract

Deflectometric profilometers are indispensable tools for the precision form measurement of beam-shaping optics of synchrotrons and x-ray free electron lasers. They are used in metrology labs for x-ray optics worldwide and are crucial for providing measurement accuracy dictated by the form tolerances for modern state-of-the-art x-ray optics. Deflectometric profilometers use surface slope (angle) to assess form, and they utilize commercial autocollimators for the contactless slope measurement. In this contribution, we discuss the influences of environmental parameters, such as temperature and air pressure, including their gradients, on high-accuracy metrology with autocollimators in profilometers. They can cause substantial systematic errors in form measurement, especially in the case of large and strongly curved optical surfaces of high dynamic range. Relative angle and form measuring errors of the order of 10 are to be expected. We characterize environmental influences by extended theoretical and experimental investigations and derive strategies for correcting them. We also discuss the possibility to minimize the contributions of some errors by the application of sophisticated experimental arrangements and methods. This work aims at approaching fundamental limits in autocollimator-based slope and form metrology.

摘要

偏折轮廓仪是同步加速器和X射线自由电子激光束整形光学元件精密形状测量中不可或缺的工具。它们在全球范围内的X射线光学计量实验室中得到应用,对于提供现代先进X射线光学元件形状公差所要求的测量精度至关重要。偏折轮廓仪利用表面斜率(角度)来评估形状,并使用商用自准直仪进行非接触式斜率测量。在本论文中,我们讨论了环境参数(如温度和气压,包括它们的梯度)对轮廓仪中使用自准直仪进行高精度计量的影响。它们会在形状测量中导致显著的系统误差,特别是在具有高动态范围的大型且强烈弯曲的光学表面的情况下。预计相对角度和形状测量误差会达到10的量级。我们通过广泛的理论和实验研究来表征环境影响,并推导校正这些影响的策略。我们还讨论了通过应用复杂的实验装置和方法来最小化某些误差影响的可能性。这项工作旨在接近基于自准直仪的斜率和形状计量的基本极限。

相似文献

1
Environmental influences on autocollimator-based angle and form metrology.环境对基于自准直仪的角度和形状测量的影响。
Rev Sci Instrum. 2019 Feb;90(2):021705. doi: 10.1063/1.5057402.
2
Aperture alignment in autocollimator-based deflectometric profilometers.基于自准直仪的偏折轮廓仪中的孔径对准
Rev Sci Instrum. 2016 May;87(5):051906. doi: 10.1063/1.4950734.
3
Self-calibration strategies for reducing systematic slope measurement errors of autocollimators in deflectometric profilometry.用于减少偏折轮廓术中自准直仪系统斜率测量误差的自校准策略。
J Synchrotron Radiat. 2024 Jul 1;31(Pt 4):670-680. doi: 10.1107/S1600577524003552. Epub 2024 Jun 5.
4
Optimization of the size and shape of the scanning aperture in autocollimator-based deflectometric profilometers.基于自准直仪的偏折轮廓仪中扫描孔径的尺寸和形状优化
Rev Sci Instrum. 2019 Feb;90(2):021717. doi: 10.1063/1.5058710.
5
Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad.纳米计量学:测量斜率误差小于100纳弧度的X射线镜的技术。
Rev Sci Instrum. 2016 May;87(5):051902. doi: 10.1063/1.4949272.
6
Super-resolution surface slope metrology of x-ray mirrors.X射线镜的超分辨率表面斜率计量学
Rev Sci Instrum. 2020 Jul 1;91(7):075113. doi: 10.1063/5.0005556.
7
Application of advanced shearing techniques to the calibration of autocollimators with small angle generators and investigation of error sources.先进剪切技术在带小角度发生器的自准直仪校准及误差源研究中的应用。
Rev Sci Instrum. 2016 May;87(5):051903. doi: 10.1063/1.4950720.
8
Multi-pitch self-calibration measurement using a nano-accuracy surface profiler for X-ray mirror metrology.使用纳米精度表面轮廓仪进行X射线镜计量的多间距自校准测量。
Opt Express. 2020 Aug 3;28(16):23060-23074. doi: 10.1364/OE.392433.
9
Advanced in situ metrology for x-ray beam shaping with super precision.用于超精密X射线束整形的先进原位计量学。
Opt Express. 2015 Jan 26;23(2):1605-14. doi: 10.1364/OE.23.001605.
10
High precision tilt stage as a key element to a universal test mirror for characterization and calibration of slope measuring instruments.高精度倾斜台是用于斜率测量仪器表征和校准的通用测试镜的关键元件。
Rev Sci Instrum. 2016 May;87(5):051904. doi: 10.1063/1.4950729.

引用本文的文献

1
Self-calibration strategies for reducing systematic slope measurement errors of autocollimators in deflectometric profilometry.用于减少偏折轮廓术中自准直仪系统斜率测量误差的自校准策略。
J Synchrotron Radiat. 2024 Jul 1;31(Pt 4):670-680. doi: 10.1107/S1600577524003552. Epub 2024 Jun 5.