Mukherjee Anjan, Yun Hoyeol, Shin Dong Hoon, Nam Jungtae, Munshi A Mazid, Dheeraj Dasa L, Fimland Bjørn-Ove, Weman Helge, Kim Keun Soo, Lee Sang Wook, Kim Dong-Chul
Department of Electronic Systems , Norwegian University of Science and Technology (NTNU) , NO-7491 Trondheim , Norway.
School of Physics , Konkuk University , 05029 Seoul , Republic of Korea.
ACS Appl Mater Interfaces. 2019 Apr 10;11(14):13514-13522. doi: 10.1021/acsami.8b20581. Epub 2019 Mar 29.
We developed a new technique to fabricate single nanowire devices with reliable graphene/nanowire contacts using a position-controlled microtransfer and an embedded nanowire structure in a planar junction configuration. A thorough study of electrical properties and fabrication challenges of single p-GaAs nanowire/graphene devices was carried out in two different device configurations: (1) a graphene bottom-contact device where the nanowire-graphene contact junction is formed by transferring a nanowire on top of graphene and (2) a graphene top-contact device where the nanowire-graphene contact junction is formed by transferring graphene on top of an embedded nanowire. For the graphene top-contact devices, graphene-nanowire-metal devices, where graphene is used as one electrode and metal is the other electrode to a nanowire, and graphene-nanowire-graphene devices, where both electrodes to a nanowire are graphene, were investigated and compared with conventional metal/p-GaAs nanowire devices. Conventional metal/p-GaAs nanowire contact devices were further investigated in embedded and nonembedded nanowire device configurations. A significantly improved current in the embedded device configuration is explained with a "parallel resistors model" where the high-resistance parts with the metal-semiconductor Schottky contact and the low-resistance parts with noncontacted facets of the hexagonal nanowires are taken into consideration. Consistently, the nonembedded nanowire structure is found to be depleted much easier than the embedded nanowires from which an estimation for a fully depleted condition has also been established.
我们开发了一种新技术,利用位置控制的微转移和平面结配置中的嵌入式纳米线结构,制造具有可靠石墨烯/纳米线接触的单纳米线器件。对单根p型砷化镓纳米线/石墨烯器件的电学性质和制造挑战进行了深入研究,研究了两种不同的器件配置:(1)石墨烯底部接触器件,其中纳米线-石墨烯接触结是通过将纳米线转移到石墨烯顶部形成的;(2)石墨烯顶部接触器件,其中纳米线-石墨烯接触结是通过将石墨烯转移到嵌入式纳米线顶部形成的。对于石墨烯顶部接触器件,研究了石墨烯-纳米线-金属器件(其中石墨烯用作一个电极,金属用作纳米线的另一个电极)和石墨烯-纳米线-石墨烯器件(其中纳米线的两个电极都是石墨烯),并与传统的金属/p型砷化镓纳米线器件进行了比较。对传统的金属/p型砷化镓纳米线接触器件在嵌入式和非嵌入式纳米线器件配置中进行了进一步研究。嵌入式器件配置中电流的显著改善用“并联电阻模型”来解释,该模型考虑了具有金属-半导体肖特基接触的高电阻部分和具有六边形纳米线非接触面的低电阻部分。一致地,发现非嵌入式纳米线结构比嵌入式纳米线更容易耗尽,并且还建立了完全耗尽条件的估计。