Cook Seyoung, Letchworth-Weaver Kendra, Tung I-Cheng, Andersen Tassie K, Hong Hawoong, Marks Laurence D, Fong Dillon D
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60202, USA.
Sci Adv. 2019 Apr 12;5(4):eaav0764. doi: 10.1126/sciadv.aav0764. eCollection 2019 Apr.
In traditional models of heteroepitaxy, the substrate serves mainly as a crystalline template for the thin-film lattice, dictating the initial roughness of the film and the degree of coherent strain. Here, performing in situ surface x-ray diffraction during the heteroepitaxial growth of LaTiO on SrTiO (001), we find that a TiO adlayer composed of the 33.7° and 45.0° reconstructions is a highly active participant in the growth process, continually diffusing to the surface throughout deposition. The effects of the TiO adlayer on layer-by-layer growth are investigated using different deposition sequences and anomalous x-ray scattering, both of which permit detailed insight into the dynamic layer rearrangements that take place. Our work challenges commonly held assumptions regarding growth on TiO-terminated SrTiO (001) and demonstrates the critical role of excess TiO surface stoichiometry on the initial stages of heteroepitaxial growth on this important perovskite oxide substrate material.
在传统的异质外延模型中,衬底主要作为薄膜晶格的晶体模板,决定薄膜的初始粗糙度和相干应变程度。在此,我们在SrTiO(001)上进行LaTiO的异质外延生长过程中进行原位表面X射线衍射,发现由33.7°和45.0°重构组成的TiO吸附层是生长过程中的高度活跃参与者,在整个沉积过程中持续扩散到表面。使用不同的沉积序列和反常X射线散射研究了TiO吸附层对逐层生长的影响,这两者都能详细洞察发生的动态层重排。我们的工作挑战了关于在TiO终止的SrTiO(001)上生长的普遍假设,并证明了过量TiO表面化学计量在这种重要的钙钛矿氧化物衬底材料上异质外延生长初始阶段的关键作用。