Ju Guangxu, Highland Matthew J, Thompson Carol, Eastman Jeffrey A, Fuoss Paul H, Zhou Hua, Dejus Roger, Stephenson G Brian
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
Department of Physics, Northern Illinois University, DeKalb, IL 60115, USA.
J Synchrotron Radiat. 2018 Jul 1;25(Pt 4):1036-1047. doi: 10.1107/S1600577518006501. Epub 2018 Jun 13.
In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory to obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator (`pink beam') agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. The methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines.
鉴于相干X射线方法的使用日益增加以及升级光束线以匹配更高源质量的需求,本文对先进光子源12ID-D光束线所提供的X射线的相干特性进行了表征。将在高达26 keV能量下测量的X射线发散度、光束尺寸、亮度和相干通量与波荡器源的计算值进行了比较,并评估了诸如镜子、单色仪和复合折射透镜等光束线光学元件的影响。利用波传播理论分析了狭缝衍射图案随狭缝宽度的变化,以获得光束发散度,进而得到相干长度。发现使用复合折射透镜对源进行成像,是确定垂直发散度的最准确方法。虽然在没有单色仪(“粉红光束”)的情况下获得的亮度和相干通量与源的计算值吻合良好,但使用单色仪测量的亮度和相干通量比源低三到六倍,主要是因为单色仪引入了垂直发散。本文所述方法应广泛适用于测量同步辐射光束线的X射线相干特性。