Bae Seokjin, Tan Yuewen, Zhuravel Alexander P, Zhang Lingchao, Zeng Shengwei, Liu Yong, Lograsso Thomas A, Venkatesan T, Anlage Steven M
Department of Physics, Center for Nanophysics and Advanced Materials, University of Maryland, College Park, Maryland 20742-4111, USA.
B. Verkin Institute for Low Temperature Physics and Engineering, National Academy of Sciences of Ukraine, UA-61103 Kharkov, Ukraine.
Rev Sci Instrum. 2019 Apr;90(4):043901. doi: 10.1063/1.5090130.
We present a new measurement method which can be used to image the gap nodal structure of superconductors whose pairing symmetry is under debate. This technique utilizes a high quality factor microwave resonance involving the sample of interest. While supporting a circularly symmetric standing wave current pattern, the sample is perturbed by a scanned laser beam, creating a photoresponse that was previously shown to reveal the superconducting gap anisotropy. Simulation and the measurement of the photoresponse of an unpatterned Nb film show less than 8% anisotropy, as expected for a superconductor with a nearly isotropic energy gap along with expected systematic uncertainty. On the other hand, measurement of a YBaCuO thin film shows a clear 4-fold symmetric image with ∼12.5% anisotropy, indicating the well-known 4-fold symmetric d gap nodal structure in the ab-plane. The deduced gap nodal structure can be further cross-checked by low temperature surface impedance data, which are simultaneously measured. The important advantage of the presented method over the previous spiral resonator method is that it does not require a complicated lithographic patterning process which limits one from testing various kinds of materials due to photoresponse arising from patterning defects. This advantage of the presented technique, and the ability to measure unpatterned samples such as planar thin films and single crystals, enables one to survey the pairing symmetry of a wide variety of unconventional superconductors.
我们提出了一种新的测量方法,可用于对配对对称性存在争议的超导体的能隙节点结构进行成像。该技术利用了涉及感兴趣样品的高品质因数微波共振。在支持圆对称驻波电流模式的同时,样品受到扫描激光束的扰动,产生一种光响应,此前已证明这种光响应能揭示超导能隙各向异性。对未图案化的铌薄膜光响应的模拟和测量显示,各向异性小于8%,这对于具有近乎各向同性能隙的超导体以及预期的系统不确定性来说是预期的结果。另一方面,对钇钡铜氧薄膜的测量显示出清晰的四重对称图像,各向异性约为12.5%,表明在ab平面中存在众所周知的四重对称d波能隙节点结构。推导得到的能隙节点结构可以通过同时测量的低温表面阻抗数据进行进一步交叉核对。与先前的螺旋谐振器方法相比,本文提出的方法的重要优势在于它不需要复杂的光刻图案化工艺,而这种工艺由于图案化缺陷产生的光响应而限制了对各种材料的测试。本文提出的技术的这一优势,以及测量未图案化样品(如平面薄膜和单晶)的能力,使人们能够研究各种非常规超导体的配对对称性。