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脉络膜痣中的扫频光学相干断层扫描及近红外反射模式

Swept-Source OCT and Near-Infrared Reflectance Patterns in Choroidal Nevi.

作者信息

Vazquez-Alfageme Clara, Papastefanou Vasilios P, Patel Praveen J, Degli-Esposti Simona, Cohen Victoria M L, Sagoo Mandeep S

机构信息

National Institute for Health and Research (NIHR) Biomedical Centre at Moorfields Eye Hospital and University College London Institute of Ophthalmology, London, United Kingdom.

Ocular Oncology Service, St. Bartholomew's Hospital and Moorfields Eye Hospital, London, United Kingdom.

出版信息

Ophthalmol Retina. 2019 May;3(5):429-435. doi: 10.1016/j.oret.2019.01.001. Epub 2019 Jan 7.

Abstract

PURPOSE

To describe the 3 distinct patterns of choroidal nevi in swept-source (SS) OCT and apply that classification to a cohort of consecutive choroidal nevi. Also, we aim to describe the findings of these lesions in near-infrared reflectance (NIR) at different wavelengths (820 and 1050 nm).

DESIGN

Single-center, retrospective, observational study.

PARTICIPANTS

One hundred four consecutive patients with choroidal nevi.

METHODS

Retrospective analysis of choroidal nevi imaged with SS OCT and NIR.

MAIN OUTCOME MEASURES

Lesions were classified according to OCT patterns as type A (high reflectivity with optical shadowing), type B (medium reflectivity with partial visualization of the scleral boundary), and type C (hyporeflective with complete visualization of the scleral boundary).

RESULTS

Of 104 choroidal nevi, 97 lesions (93.3%) could be classified into 1 of the SS OCT patterns. Forty-nine percent corresponded to type A, 26% corresponded to type C, and 18.3% corresponded to type B. In NIR (n = 820), 76% of lesions were hyperreflective, whereas in NIR (n = 1050), most of the lesions were hyporeflective (59.6%; inverse reflectance).

CONCLUSIONS

Choroidal nevi present distinct patterns according to SS OCT features. Clinical implications are yet to be determined. In NIR, inverse reflectance may be a consequence of the confocality of the device, rather than a property of the lesions.

摘要

目的

描述扫频源(SS)光学相干断层扫描(OCT)中脉络膜痣的3种不同模式,并将该分类应用于一组连续的脉络膜痣。此外,我们旨在描述这些病变在不同波长(820和1050 nm)近红外反射率(NIR)下的表现。

设计

单中心、回顾性观察研究。

参与者

104例连续的脉络膜痣患者。

方法

对采用SS OCT和NIR成像的脉络膜痣进行回顾性分析。

主要观察指标

根据OCT模式将病变分为A类(高反射率伴光学阴影)、B类(中等反射率伴巩膜边界部分可见)和C类(低反射率伴巩膜边界完全可见)。

结果

104例脉络膜痣中,97个病变(93.3%)可归入SS OCT模式中的一种。49%对应A类,26%对应C类,18.3%对应B类。在NIR(n = 820)中,76%的病变为高反射,而在NIR(n = 1050)中,大多数病变为低反射(59.6%;反向反射率)。

结论

脉络膜痣根据SS OCT特征呈现不同模式。其临床意义尚待确定。在NIR中,反向反射率可能是设备共焦性的结果,而非病变的特性。

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