Lu Xiang, Rodenko Olga, Zhang Yueqian, Gross Herbert
Appl Opt. 2019 May 1;58(13):3589-3596. doi: 10.1364/AO.58.003589.
The use of fluorescence in microscopy is a well-known technology. Due to autofluorescence in the materials of optical components, the contrast of the image is degraded. The calculation of autofluorescence is usually performed by brute-force methods such as the Monte Carlo-based volume scattering. The efficiency of calculations in this case is extremely low, and a huge number of rays must be calculated. In stray light calculations, the concept of important sampling is used to reduce computational effort. The idea is to calculate only rays, which have the chance to reach the target surface. The fluorescence conversion can be considered to be a scatter process, and therefore a modification of this idea is used here. The reduction factor is calculated by comparing the size of the illuminated phase space domain with the corresponding acceptance domain in every z plane of the lenses. The boundaries of the domains are determined by tracing the limiting rays of the light cone of the source as well as the pixel area under consideration. The small overlap of both domains can be estimated by geometrical considerations. The correct photometric scaling and the discretization of the volumes must be performed. The errors resulting from necessary approximations can be corrected without greatly increasing computational effort. The run time is reduced by a factor of 10. It is shown with some practical examples of microscope lenses that the results are comparable with conventional methods. Additionally, a quasi-analytical model that describes the dependence of autofluorescence on various lens parameters is derived.
荧光在显微镜中的应用是一项众所周知的技术。由于光学元件材料中的自发荧光,图像的对比度会降低。自发荧光的计算通常通过诸如基于蒙特卡罗的体积散射等蛮力方法来进行。在这种情况下,计算效率极低,必须计算大量的光线。在杂散光计算中,重要抽样的概念被用来减少计算量。其思路是只计算有机会到达目标表面的光线。荧光转换可以被视为一个散射过程,因此这里使用了对这一思路的一种改进。通过比较透镜每个z平面中照明相空间域的大小与相应的接受域的大小来计算缩减因子。这些域的边界是通过追踪光源光锥的极限光线以及所考虑的像素区域来确定的。两个域的小重叠可以通过几何考虑来估计。必须进行正确的光度缩放和体积离散化。由必要近似产生的误差可以在不大大增加计算量的情况下得到校正。运行时间减少了10倍。通过一些显微镜透镜的实际例子表明,结果与传统方法相当。此外,还推导了一个描述自发荧光对各种透镜参数依赖性的准分析模型。