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半导体金属有机骨架的直接辐射探测。

Direct Radiation Detection by a Semiconductive Metal-Organic Framework.

机构信息

State Key Laboratory of Radiation Medicine and Protection, School for Radiological and interdisciplinary Sciences (RAD-X) and Collaborative Innovation Center of Radiation Medicine of Jiangsu Higher Education Institutions, Soochow University, Suzhou 215123, China.

Key Laboratory of Radiation Physics and Technology, Ministry of Education, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China.

出版信息

J Am Chem Soc. 2019 May 22;141(20):8030-8034. doi: 10.1021/jacs.9b01270. Epub 2019 May 9.

DOI:10.1021/jacs.9b01270
PMID:31064178
Abstract

Semiconductive metal-organic frameworks (MOFs) have attracted extraordinary research interest in recent years; however, electronic applications based on these emerging materials are still in their infancy. Herein, we show that a lanthanide-based semiconductive MOF () can effectively convert X-ray photons to electrical current signals under continuous hard X-ray radiation. The semiconductive MOF-based polycrystalline detection device presents a promising X-ray sensitivity with the value of 23.8 μC Gy cm under 80 kV X-ray exposure, competitive with the commercially available amorphous selenium (-Se) detector. The lowest detectable X-ray dose rate is 0.705 μGy s, representing the record value among all X-ray detectors fabricated by polycrystalline materials. This work discloses the first demonstration of hard radiation detection by semiconductive MOFs, providing a horizon that can guide the synthesis of a new generation of radiation detection materials by taking the advantages of structural designability and property tunability in the MOF system.

摘要

近年来,半导体金属-有机骨架(MOFs)引起了人们的极大研究兴趣;然而,基于这些新兴材料的电子应用仍处于起步阶段。在此,我们展示了一种基于镧系元素的半导体 MOF()可以在连续硬 X 射线辐射下有效地将 X 射线光子转换为电流信号。基于半导体 MOF 的多晶探测器件在 80 kV X 射线辐照下表现出有前途的 X 射线灵敏度,其值为 23.8 μC Gy cm,可与市售非晶硒 (-Se) 探测器相媲美。最低可检测 X 射线剂量率为 0.705 μGy s,这是所有由多晶材料制备的 X 射线探测器中的记录值。这项工作首次揭示了半导体 MOFs 对硬辐射的检测,为通过 MOF 系统的结构设计和性能可调性来指导新一代辐射探测材料的合成提供了一个新的视角。

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