眼电图、暗适应测量法和激光干涉测量法。
Electro-oculography, dark adaptometry, and laser interferometry.
作者信息
Richter S J, Sherman J
出版信息
J Am Optom Assoc. 1979 Jan;50(1):101-4.
PMID:310822
Abstract
This paper discusses the basic concepts of electrooculography (E.O.G.), dark adaptometry, and laser interferometry. Included is the clinical relevance of each procedure.
摘要
本文讨论了眼电图（E.O.G.）、暗适应测量法和激光干涉测量法的基本概念。其中还包括了每种检查方法的临床意义。
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