Department of Agronomy and Plant Genetics, University of Minnesota, St. Paul, MN 55108.
Department of Plant Pathology, University of Nebraska, Lincoln, NE 68503-0722.
G3 (Bethesda). 2019 Oct 7;9(10):3139-3152. doi: 10.1534/g3.119.400347.
Goss's bacterial wilt and leaf blight is a disease of maize caused by the gram positive bacterium subsp. (). First discovered in Nebraska, Goss's wilt has now spread to major maize growing states in the United States and three provinces in Canada. Previous studies conducted using elite maize inbred lines and their hybrids have shown that resistance to Goss's wilt is a quantitative trait. The objective of this study was to further our understanding of the genetic basis of resistance to Goss's wilt by using a combined approach of genome-wide association mapping and gene co-expression network analysis. Genome-wide association analysis was accomplished using a diversity panel consisting of 555 maize inbred lines and a set of 450 recombinant inbred lines (RILs) from three bi-parental mapping populations, providing the most comprehensive screening of Goss's wilt resistance to date. Three SNPs in the diversity panel and 10 SNPs in the combined dataset, including the diversity panel and RILs, were found to be significantly associated with Goss's wilt resistance. Each significant SNP explained 1-5% of the phenotypic variation for Goss's wilt (total of 8-11%). To augment the results of genome-wide association mapping and help identify candidate genes, a time course RNA sequencing experiment was conducted using resistant (N551) and susceptible (B14A) maize inbred lines. Gene co-expression network analysis of this time course experiment identified one module of 141 correlated genes that showed differential regulation in response to inoculations in both resistant and susceptible lines. SNPs inside and flanking these genes explained 13.3% of the phenotypic variation. Among 1,000 random samples of genes, only 8% of samples explained more phenotypic variance for Goss's wilt resistance than those implicated by the co-expression network analysis. While a statistically significant enrichment was not observed ( < 0.05), these results suggest a possible role for these genes in quantitative resistance at the field level and warrant more research on combining gene co-expression network analysis with quantitative genetic analyses to dissect complex disease resistance traits. The results of the GWAS and co-expression analysis both support the complex nature of resistance to this important disease of maize.
高氏细菌萎蔫病和叶斑病是一种由革兰氏阳性细菌亚种()引起的玉米病害。该病最初在内布拉斯加州发现,现已蔓延到美国主要的玉米种植州和加拿大的三个省份。先前使用优秀的玉米自交系及其杂种进行的研究表明,对高氏细菌萎蔫病的抗性是一种数量性状。本研究的目的是通过全基因组关联图谱和基因共表达网络分析的联合方法,进一步了解对高氏细菌萎蔫病抗性的遗传基础。使用由 555 个玉米自交系和来自三个双亲图谱群体的 450 个重组自交系(RIL)组成的多样性面板进行全基因组关联分析,提供了迄今为止对高氏细菌萎蔫病抗性的最全面筛选。在多样性面板中发现了 3 个 SNP,在包含多样性面板和 RIL 的组合数据集中发现了 10 个 SNP,与高氏细菌萎蔫病抗性显著相关。每个显著 SNP 解释了高氏细菌萎蔫病(共 8-11%)表型变异的 1-5%。为了增强全基因组关联图谱的结果并帮助鉴定候选基因,使用抗性(N551)和易感(B14A)玉米自交系进行了时间过程 RNA 测序实验。对该时间过程实验的基因共表达网络分析鉴定了一个包含 141 个相关基因的模块,这些基因在抗性和易感系中对接种反应表现出差异调节。这些基因内和侧翼的 SNP 解释了表型变异的 13.3%。在 1000 个随机基因样本中,只有 8%的样本比共表达网络分析所暗示的样本对高氏细菌萎蔫病抗性的表型方差解释更多。虽然没有观察到统计学上的显著富集(<0.05),但这些结果表明这些基因在田间水平的数量抗性中可能发挥作用,值得进一步研究将基因共表达网络分析与数量遗传分析相结合,以剖析复杂的疾病抗性性状。GWAS 和共表达分析的结果都支持了对这种玉米重要病害抗性的复杂性。