Bugaev Aram L, Skorynina Alina A, Kamyshova Elizaveta G, Lomachenko Kirill A, Guda Alexander A, Soldatov Alexander V, Lamberti Carlo
The Smart Materials Research Institute, Southern Federal University, Sladkova 178/24, 344090, Rostov-on-Don, Russia.
European Synchrotron Radiation Facility, 71 Avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.
Data Brief. 2019 Jul 17;25:104280. doi: 10.1016/j.dib.2019.104280. eCollection 2019 Aug.
We report a series of Pd -edge and Pt -edge X-ray absorption spectra (XAS) collected in situ during thermal treatment of functionalized UiO-67-Pd and UiO-67-Pt metal-organic frameworks in inert and reducing atmospheres. We present raw synchrotron data from three subsequent experiments at different beamlines, normalized XAS spectra and -weighted oscillatory χ() functions extracted from one of the datasets. Pd -edge spectra were collected for the samples in 5% H/He, 3% H/He and pure He in the temperature range from room temperature (RT) to 450 °C. Pt -edge were collected for the samples in 3% H/He, 10% H/He and pure He in the temperature range from RT to 300 °C. All spectra are reported together with the used atmosphere and temperature. For the analysis of all reported datasets, please see "Evolution of Pt and Pd species in functionalized UiO-67 metal-organic frameworks". Fourier-analysis of Pd -edge is reported in "Formation and growth of Pd nanoparticles in UiO-67 MOF by in situ EXAFS".
我们报告了一系列在惰性和还原气氛中对功能化的UiO-67-Pd和UiO-67-Pt金属有机框架进行热处理期间原位收集的Pd边和Pt边X射线吸收光谱（XAS）。我们展示了来自不同光束线的三个后续实验的原始同步加速器数据、归一化的XAS光谱以及从其中一个数据集中提取的k加权振荡χ(k)函数。在5% H₂/He、3% H₂/He和纯He气氛中，于室温（RT）至450 °C的温度范围内对样品收集Pd边光谱。在3% H₂/He、10% H₂/He和纯He气氛中，于RT至300 °C的温度范围内对样品收集Pt边光谱。所有光谱均与所用气氛和温度一同报告。有关所有报告数据集的分析，请参阅“功能化UiO-67金属有机框架中Pt和Pd物种的演变”。Pd边的傅里叶分析报告在“通过原位EXAFS在UiO-67 MOF中Pd纳米颗粒的形成与生长”中。
