Department of Materials Science and Engineering and Materials Research Laboratory , University of Illinois at Urbana-Champaign , Urbana , Illinois 61801 , United States.
ACS Appl Mater Interfaces. 2019 Sep 25;11(38):34841-34853. doi: 10.1021/acsami.9b08864. Epub 2019 Sep 11.
The oxygen deficiency or excess, as reflected in the nonstoichiometry of oxide films, plays a crucial role in their functional properties for applications such as micro solid oxide fuel cells, catalysis, sensors, ferroelectrics, and memristors. High concentrations of oxygen vacancies may be beneficial or detrimental according to the application, and hence there is interest in controlling the oxygen content of films without resorting to compositional changes. Here, we demonstrate that substantial changes in the nonstoichiometry of PrCeO (PCO), a model mixed ionic electronic conductor, can be achieved by fabricating multilayers with an inert material, SrTiO (STO). We fabricated heterostructures using pulsed laser deposition, keeping the total thickness of PCO and STO constant while varying the number of layers and thickness of each individual layer, to probe the effects of the PCO/STO interfaces. Conductivity measurements as a function of oxygen partial pressure () and temperature showed a significant weakening of the dependence compared to bulk PCO, which scaled with the density of interfaces. We confirmed that this change was due to variations in nonstoichiometry, by optical transmission measurements, and show that the lower oxygen content is consistent with a decrease in the effective oxygen reduction enthalpy of PCO. These results exemplify the dramatic differences in properties between films and their bulk counterparts, achievable by interface engineering, and provide generalized insight into tailoring the properties of mixed ionic electronic conductors at the nanoscale.
氧的缺失或过剩,体现在氧化物薄膜的非化学计量比中,对其在微固体氧化物燃料电池、催化、传感器、铁电体和忆阻器等应用中的功能特性起着至关重要的作用。根据应用的不同,高浓度的氧空位可能是有益的也可能是有害的,因此人们有兴趣在不改变组成的情况下控制薄膜中的氧含量。在这里,我们证明了通过使用惰性材料 SrTiO(STO)制造多层结构,可以显著改变 PrCeO(PCO)的非化学计量比,PCO 是一种混合离子电子导体的模型材料。我们使用脉冲激光沉积制造了异质结构,在保持 PCO 和 STO 的总厚度不变的情况下,改变每个单层的层数和厚度,以探测 PCO/STO 界面的影响。氧分压()和温度的电导率测量结果表明,与体相 PCO 相比,其依赖关系显著减弱,与界面密度成比例。我们通过光学透射测量证实了这种变化是由于非化学计量比的变化引起的,并表明 PCO 的有效氧还原焓的降低导致了氧含量的降低。这些结果说明了通过界面工程可以实现薄膜与其体相之间的性质的显著差异,并为在纳米尺度上调整混合离子电子导体的性质提供了一般性的见解。