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使用等离子体聚焦装置的质子和氩离子对辐照钨和铜的损伤研究。

Damage study of irradiated tungsten and copper using proton and argon ions of a plasma focus device.

作者信息

Seyedhabashi Mir Mohammadreza, Tafreshi Mohammad Amirhamzeh, Shirani Bidabadi Babak, Shafiei Sepideh, Abdisaray Akbar

机构信息

Plasma Physics and Nuclear Fusion Research School, Nuclear Science and Technology Research Institute (NSTRI), Atomic Energy Organization of Iran (AEOI), Tehran, 14399-51113, Iran.

Department of Nuclear Engineering, University of Isfahan, Isfahan, Iran.

出版信息

Appl Radiat Isot. 2019 Dec;154:108875. doi: 10.1016/j.apradiso.2019.108875. Epub 2019 Aug 23.

DOI:10.1016/j.apradiso.2019.108875
PMID:31470188
Abstract

The destructive effects of proton and argon ions produced in a low energy plasma focus device on the surface of tungsten and copper were investigated. Optical microscopy, SEM, EDX, XRD and ERD analysis were performed for initial and irradiated samples. The results showed that total thermal impact under the irradiation by argon is much more significant than that by hydrogen. Sub-micrometer blisters, clusters of joined bubbles and rupture patterns were observed on the surface of copper after irradiation by argon. Micro-cracks were observed on the tungsten samples irradiated by argon, which indicate fast annealing of the molten surface. Many dense blisters and evidence of ion sputtering were observed on the surfaces irradiated by protons. Results of ERD analysis showed that the highest concentration of hydrogen is 24% in the second layer and at a depth of 20-55 nm from the tungsten surface. In the copper sample, the highest density of hydrogen was found to be 23% in the second layer and at a depth of 28-68 nm. Also, the highest penetration depth of protons into the tungsten and copper samples was 118 nm and 160 nm, respectively.

摘要

研究了低能量等离子体聚焦装置中产生的质子和氩离子对钨和铜表面的破坏作用。对初始样品和辐照后的样品进行了光学显微镜、扫描电子显微镜(SEM)、能谱仪(EDX)、X射线衍射仪(XRD)和弹性反冲探测分析(ERD)。结果表明,氩辐照下的总热影响比氢辐照下的更为显著。氩辐照后,在铜表面观察到亚微米级水泡、相连气泡簇和破裂图案。在氩辐照的钨样品上观察到微裂纹,这表明熔融表面快速退火。在质子辐照的表面观察到许多密集水泡和离子溅射迹象。ERD分析结果表明,钨表面第二层中氢的最高浓度为24%,距表面深度为20 - 55纳米。在铜样品中,发现第二层中氢的最高密度为23%,深度为28 - 68纳米。此外,质子在钨和铜样品中的最大穿透深度分别为118纳米和160纳米。

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