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基于组合折射角和相位测量的硅平面光波导传输型折射率传感器设计。

Design of Transmission-Type Refractive Index Sensor, Based on Silica Planar Lightwave Circuit Using Combination of Refractive Angle and Phase Measurements.

机构信息

Faculty of Engineering and Design, Kagawa University, 2217-20 Hayashi-cho, Takamatsu, Kagawa 761-0396, Japan.

出版信息

Sensors (Basel). 2019 Sep 22;19(19):4095. doi: 10.3390/s19194095.

Abstract

A transmission-type refractive index sensor, based on planar lightwave circuit (PLC) technology is proposed. In the proposed structure, we introduce a combination of coarse measurements, using the dependence of the angle of refraction and fine measurement, and the dependence of the phase on the refractive index to measure the absolute refractive index precisely, without expensive optical measurement equipment. The theoretical model of the proposed refractive index sensor is derived based on Fourier optics and transfer function to simulate its performance. The simulation results for the use of the 2.5%-Δ silica-based PLC technology indicate that the proposed structure has the potential to achieve a refractive index error of approximately 1 × 10 RIU or less when a monitored power deviation of ±0.05 dB is accepted.

摘要

提出了一种基于平面光波导(PLC)技术的透射式折射率传感器。在提出的结构中,我们引入了粗测量的组合,利用折射角的依赖关系和精细测量,以及相位对折射率的依赖关系来精确测量绝对折射率,而无需昂贵的光学测量设备。基于傅里叶光学和传递函数推导出了所提出的折射率传感器的理论模型,以模拟其性能。使用 2.5%-Δ 二氧化硅基 PLC 技术的仿真结果表明,当接受监测功率偏差±0.05 dB 时,所提出的结构有可能实现折射率误差约为 1×10 RIU 或更小。

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