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TDCR测量中两种不同符合计数算法的研究。

Study of two different coincidence counting algorithms in TDCR measurements.

作者信息

Dutsov Ch, Mitev K, Cassette P, Jordanov V

机构信息

Sofia University "St. Kliment Ohridski", Faculty of Physics, Bulgaria.

Sofia University "St. Kliment Ohridski", Faculty of Physics, Bulgaria.

出版信息

Appl Radiat Isot. 2019 Dec;154:108895. doi: 10.1016/j.apradiso.2019.108895. Epub 2019 Sep 13.

Abstract

This work presents a comparison of two different logics for imposing extending-type dead-time in TDCR measurements: the common dead-time (CDT) and the individual dead-time (IDT) counting logics. The CDT is implemented in the widely used MAC3 TDCR counting module and the IDT was recently implemented in the nanoTDCR counting device. The performance of the two counting algorithms is evaluated by three experimental setups and a dedicated Monte Carlo (MC) code for the simulation of realistic TDCR events. An excellent agreement is observed between the two counting logics for measurements of the pure β-emitting radionuclides H, C, Ni and Sr/Y for which the relative deviations in measured activities are in all cases less than 0.27%. For the measured Rn sources, we observe relative deviations up to 0.25% between the logical sum of double coincidences counting rates obtained with the two counting logics. The differences are in the double coincidence counting rate estimates which propagate to the estimates of the activity. Excellent agreement was observed between the CDT and IDT in MC simulated measurements of H where relative deviations are less than 0.24% for activities up to 70 kBq. The IDT counting algorithm seems to have an advantage in this particular case as it results in the same counting rates and calculated activities but with a significant reduction in the double coincidences dead-time.

摘要

这项工作比较了在TDCR测量中施加扩展型死时间的两种不同逻辑:通用死时间(CDT)和个体死时间(IDT)计数逻辑。CDT在广泛使用的MAC3 TDCR计数模块中实现,而IDT最近在nanoTDCR计数设备中实现。通过三种实验装置和一个用于模拟实际TDCR事件的专用蒙特卡罗(MC)代码来评估这两种计数算法的性能。对于纯β发射放射性核素H、C、Ni和Sr/Y的测量,两种计数逻辑之间观察到了极好的一致性,在所有情况下,测量活度的相对偏差均小于0.27%。对于测量的Rn源,我们观察到两种计数逻辑获得的双符合计数率的逻辑和之间的相对偏差高达0.25%。差异在于双符合计数率估计,其传播到活度估计中。在MC模拟的H测量中,CDT和IDT之间观察到了极好的一致性,对于高达70 kBq的活度,相对偏差小于0.24%。在这种特殊情况下,IDT计数算法似乎具有优势,因为它产生相同的计数率和计算活度,但双符合死时间显著减少。

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